| Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns S Vespucci, A Winkelmann, G Naresh-Kumar, KP Mingard, D Maneuski, ... Physical Review B 92 (20), 205301, 2015 | 59 | 2015 |
| Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction G Naresh-Kumar, A Vilalta-Clemente, H Jussila, A Winkelmann, G Nolze, ... Scientific Reports 7 (1), 10916, 2017 | 27 | 2017 |
| Robust energy calibration technique for photon counting spectral detectors S Vespucci, CS Park, R Torrico, M Das IEEE transactions on medical imaging 38 (4), 968-978, 2018 | 20 | 2018 |
| Practical application of direct electron detectors to EBSD mapping in 2D and 3D KP Mingard, M Stewart, MG Gee, S Vespucci, C Trager-Cowan Ultramicroscopy 184, 242-251, 2018 | 18 | 2018 |
| Diffraction effects and inelastic electron transport in angle‐resolved microscopic imaging applications A Winkelmann, G Nolze, S Vespucci, G Naresh‐Kumar, C Trager‐Cowan, ... Journal of Microscopy 267 (3), 330-346, 2017 | 17 | 2017 |
| Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Semiconductor Science and Technology 35 (5), 054001, 2020 | 13 | 2020 |
| Exploring transmission Kikuchi diffraction using a Timepix detector S Vespucci, A Winkelmann, K Mingard, D Maneuski, V O'Shea, ... Journal of Instrumentation 12 (02), C02075-C02075, 2017 | 12 | 2017 |
| Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Photonics Research 7 (11), B73-B82, 2019 | 11 | 2019 |
| Diffractive triangulation of radiative point sources S Vespucci, G Naresh-Kumar, C Trager-Cowan, KP Mingard, D Maneuski, ... Applied Physics Letters 110 (12), 2017 | 7 | 2017 |
| Experimental validation of a multi-step material decomposition method for spectral CT NR Fredette, S Vespucci, M Das Medical Imaging 2019: Physics of Medical Imaging 10948, 723-730, 2019 | 6 | 2019 |
| Examining phase contrast sensitivity to signal location and tissue thickness in breast imaging S Vespucci, C Lewis, CS Park, M Das Medical Imaging 2018: Physics of Medical Imaging 10573, 533-541, 2018 | 5 | 2018 |
| Contribution of scatter and beam hardening to phase contrast imaging C Lewis, I Vazquez, S Vespucci, M Das Medical Imaging 2019: Physics of Medical Imaging 10948, 1274-1280, 2019 | 3 | 2019 |
| Method and system for determining the position of a radiation source A Winkelmann, S Vespucci US Patent 10,234,282, 2019 | 2 | 2019 |
| Spectrally varying spatial frequency properties of a small pixel photon counting detector S Vespucci, M Das Medical Imaging 2018: Physics of Medical Imaging 10573, 1273-1279, 2018 | 1 | 2018 |
| Electron channeling contrast imaging of defects in III-nitride semiconductors C Trager-Cowan, G Naresh-Kumar, N Allehiani, S Kraeusel, B Hourahine, ... Microscopy and Microanalysis 20 (S3), 1024-1025, 2014 | 1 | 2014 |
| Methods and systems for determining the absolute structure of crystal S Vespucci, B Buijsse US Patent App. 17/939,932, 2024 | | 2024 |
| Methods and systems for acquiring three-dimensional electron diffraction data B Buijsse, JS Belapure, A Henstra, MP Janus, S Vespucci US Patent 11,815,476, 2023 | | 2023 |
| System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy I Lazić, S Vespucci, EG Bosch, BH Freitag US Patent 11,211,223, 2021 | | 2021 |
| Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... IOP Conference Series: Materials Science and Engineering 891 (1), 012023, 2020 | | 2020 |
| Development of an energy filtering direct electron detector for diffraction studies in the SEM S Vespucci | | 2018 |
