| Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters T Vayssade, F Azaïs, L Latorre, F Lefèvre IEEE Transactions on Device and Materials Reliability 19 (1), 16-24, 2019 | 10 | 2019 |
| EVM measurement of RF ZigBee transceivers using standard digital ATE T Vayssade, F Azaïs, L Latorre, F Lefèvre 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 6 | 2020 |
| Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition T Vayssade, F Azaïs, L Latorre, F Lefevre 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 6 | 2019 |
| Exploration of a digital-based solution for the generation of 2.4 GHz OQPSK test stimuli T VAYSSADE, M CHEHAITLY, F AZAIS, L LATORRE, F LEFEVRE 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 4 | 2021 |
| Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE T Vayssade, F Azaïs, L Latorre, F Lefèvre 2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018 | 4 | 2018 |
| Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ... 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 3 | 2020 |
| Digital generation of single tone FM/PM test stimuli: a theoretical analysis K Tahraoui, T Vayssade, F Lefèvre, L Latorre, F Azaïs 2024 IEEE 25th Latin American Test Symposium (LATS), 1-6, 2024 | 2 | 2024 |
| Digital test of ZigBee transmitters: Validation in industrial test environment T Vayssade, F Azaïs, L Latorre, F Lefèvre 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 396-401, 2021 | 1 | 2021 |
| Low-cost EVM measurement of ZigBee transmitters from 1-bit under-sampled acquisition T Vayssade, F Azaïs, L Latorre, F Lefèvre IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020 | 1 | 2020 |
| Producing a Bidirectional ATPG Compliant Verilog-HDL Memory Model of SRAM D Ronga, X Xhafa, E Faehn, P Girard, T Vayssade, A Virazel 2024 IEEE International Conference on Design, Test and Technology of …, 2024 | | 2024 |
| Digital generation of RF phase-modulated test stimuli: application to BPSK modulation scheme K Tahraoui, R Burelle, T Vayssade, F Lefevre, L Latorre, F Azaïs 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2024 | | 2024 |
| Digital-Based Solution for the Generation of FM/pm Test Stimuli K Tahraoui, T Vayssade, F Lefèvre, L Latorre, F Azaïs IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | | 2024 |
| Comparaison des Approches de Lockstep pour la Tolérance aux Fautes des FPGAs Utilisés en Milieu Radiatif H Closquinet, F Miller, P Girard, T Vayssade, A Virazel 18e Colloque National du GDR SoC², 2024 | | 2024 |
| Low-cost digital solution for production test of ZigBee transmitters Special Session “AMS-RF testing” T Vayssade, F Azaïs, L Latorre, F Lefèvre 2023 IEEE 24th Latin American Test Symposium (LATS), 1-2, 2023 | | 2023 |
| Une approche digitale pour le test faible coût de circuits intégrés RF: application à un transceiver ZigBee T Vayssade Université Montpellier, 2020 | | 2020 |
| Low-cost testing of a 2.4 GHz ZigBee transmitter using standard digital ATE T Vayssade, F Azaïs, L Latorre, F Lefèvre European Test Symposium (ETS), 2020 | | 2020 |
| Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATE T Vayssade, F Azaïs, L Latorre, F Lefevre South European Test Seminar (SETS), 2019 | | 2019 |
| SPECIAL SECTION ON IOLTS D Gizopoulos, D Alexandrescu, M Nicolaidis, LB Faber, ML Flottes, ... | | |
