| Understanding multidimensional verification: Where functional meets non-functional X Lai, A Balakrishnan, T Lange, M Jenihhin, T Ghasempouri, J Raik, ... Microprocessors and microsystems 71, 102867, 2019 | 18 | 2019 |
| Challenges of reliability assessment and enhancement in autonomous systems M Jenihhin, MS Reorda, A Balakrishnan, D Alexandrescu 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 18 | 2019 |
| Composing graph theory and deep neural networks to evaluate seu type soft error effects A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2020 9th Mediterranean Conference on Embedded Computing (MECO), 1-5, 2020 | 15 | 2020 |
| Machine learning to tackle the challenges of transient and soft errors in complex circuits T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 14 | 2019 |
| On the estimation of complex circuits functional failure rate by machine learning techniques T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems …, 2019 | 13 | 2019 |
| Machine learning clustering techniques for selective mitigation of critical design features T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 11 | 2020 |
| Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 72-78, 2019 | 9 | 2019 |
| The validation of graph model-based, gate level low-dimensional feature data for machine learning applications A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and …, 2019 | 8 | 2019 |
| Modeling Soft-Error Reliability Under Variability A Balakrishnan, GC Medeiros, CC Gürsoy, S Hamdioui, M Jenihhin, ... 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021 | 3 | 2021 |
| On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines X Lai, T Lange, A Balakrishnan, D Alexandrescu, M Jenihhin 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration …, 2021 | 1 | 2021 |
| Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis A Balakrishnan, D Alexandrescu, M Jenihhin, T Lange, M Glorieux 2021 22nd International Symposium on Quality Electronic Design (ISQED), 24-30, 2021 | 1 | 2021 |
| Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models D Alexandrescu, A Balakrishnan, T Lange, M Glorieux 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 1 | 2020 |
| A Synthetic, Hierarchical Approach for Modelling and Managing Complex Systems’ Quality and Reliability A Balakrishnan | | |
| 1.1 Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process M Ebara, K Yamada, J Furuta, K Kobayashi, T Lange, A Balakrishnan, ... | | |
| Daghero, Francesco 150 de Almeida Ramos, Elias 184 De Sio, Corrado 114 Decoudu, Yoan 102 Della-Marca, Vincenzo 72 QA Ahmed, D Alexandrescu, H Amrouch, C Antonopoulos, S Azimi, ... | | |
