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Jeong-Won Yoon
Jeong-Won Yoon
Assistant Professor, Chungbuk National University
在 chungbuk.ac.kr 的电子邮件经过验证
标题
引用次数
引用次数
年份
IMC morphology, interfacial reaction and joint reliability of Pb-free Sn–Ag–Cu solder on electrolytic Ni BGA substrate
JW Yoon, SW Kim, SB Jung
Journal of Alloys and Compounds 392 (1-2), 247-252, 2005
1652005
Intermetallic compound layer growth at the interface between Sn–Cu–Ni solder and Cu substrate
JW Yoon, YH Lee, DG Kim, HB Kang, SJ Suh, CW Yang, CB Lee, ...
Journal of alloys and compounds 381 (1-2), 151-157, 2004
1612004
Wettability and interfacial reactions of Sn–Ag–Cu/Cu and Sn–Ag–Ni/Cu solder joints
JW Yoon, BI Noh, BK Kim, CC Shur, SB Jung
Journal of alloys and compounds 486 (1-2), 142-147, 2009
1562009
Interfacial reaction and mechanical properties of eutectic Sn–0.7 Cu/Ni BGA solder joints during isothermal long-term aging
JW Yoon, SW Kim, SB Jung
Journal of Alloys and compounds 391 (1-2), 82-89, 2005
1462005
Reliability investigation and interfacial reaction of ball-grid-array packages using the lead-free Sn-Cu solder
JW Yoon, SW Kim, JM Koo, DG Kim, SB Jung
Journal of Electronic Materials 33, 1190-1199, 2004
1082004
Growth of an intermetallic compound layer with Sn-3.5 Ag-5Bi on Cu and Ni-P/Cu during aging treatment
JW Yoon, CB Lee, SB Jung
Journal of electronic materials 32, 1195-1202, 2003
1032003
Comparative study of ENIG and ENEPIG as surface finishes for a Sn-Ag-Cu solder joint
JW Yoon, BI Noh, SB Jung
Journal of electronic materials 40, 1950-1955, 2011
1012011
Interfacial reactions between Sn–0.4 Cu solder and Cu substrate with or without ENIG plating layer during reflow reaction
JW Yoon, SB Jung
Journal of alloys and compounds 396 (1-2), 122-127, 2005
972005
Interfacial reactions and shear strengths between Sn-Ag-based Pb-free solder balls and Au/EN/Cu metallization
SW Kim, JW Yoon, SB Jung
Journal of electronic materials 33, 1182-1189, 2004
972004
Interfacial reactions between Sn-58 mass% Bi eutectic solder and (Cu, electroless Ni-P/Cu) substrate
JW Yoon, CB Lee, SB Jung
Materials transactions 43 (8), 1821-1826, 2002
972002
Characteristic evaluation of electroless nickel–phosphorus deposits with different phosphorus contents
JW Yoon, JH Park, CC Shur, SB Jung
Microelectronic Engineering 84 (11), 2552-2557, 2007
932007
IMC growth and shear strength of Sn-Ag-Bi-In/Au/Ni/Cu BGA joints during aging
JW Yoon, SW Kim, SB Jung
Materials transactions 45 (3), 727-733, 2004
932004
Investigation of interfacial reactions between Sn–5Bi solder and Cu substrate
JW Yoon, SB Jung
Journal of Alloys and Compounds 359 (1-2), 202-208, 2003
912003
Cu–Sn and Ni–Sn transient liquid phase bonding for die-attach technology applications in high-temperature power electronics packaging
BS Lee, SK Hyun, JW Yoon
Journal of Materials Science: Materials in Electronics 28, 7827-7833, 2017
872017
Sequential interfacial intermetallic compound formation of Cu6Sn5 and Ni3Sn4 between Sn–Ag–Cu solder and ENEPIG substrate during a reflow process
JW Yoon, BI Noh, JH Yoon, HB Kang, SB Jung
Journal of Alloys and Compounds 509 (9), L153-L156, 2011
852011
Effect of reflow time on interfacial reaction and shear strength of Sn–0.7 Cu solder/Cu and electroless Ni–P BGA joints
JW Yoon, SW Kim, SB Jung
Journal of alloys and compounds 385 (1-2), 192-198, 2004
832004
Effect of isothermal aging on intermetallic compound layer growth at the interface between Sn-3.5 Ag-0.75 Cu solder and Cu substrate
JW Yoon, SB Jung
Journal of materials science 39, 4211-4217, 2004
822004
Growth kinetics of Ni3Sn4 and Ni3P layer between Sn–3.5 Ag solder and electroless Ni–P substrate
JW Yoon, SB Jung
Journal of alloys and compounds 376 (1-2), 105-110, 2004
762004
Intermetallic compound layer formation between Sn–3.5 mass% Ag BGA solder ball and (Cu, immersion Au/electroless Ni–P/Cu) substrate
CB Lee, JW Yoon, SJ Suh, SB Jung, CW Yang, CC Shur, YE Shin
Journal of Materials Science: Materials in Electronics 14, 487-493, 2003
702003
Interfacial reactions and shear strength on Cu and electrolytic Au/Ni metallization with Sn-Zn solder
JW Yoon, SB Jung
Journal of materials research 21 (6), 1590-1599, 2006
672006
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