| Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation M Glorieux, A Evans, T Lange, AD In, D Alexandrescu, C Boatella-Polo, ... 2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018 | 24 | 2018 |
| Natalizumab treatment shows low cumulative probabilities of confirmed disability worsening to EDSS milestones in the long-term setting M Trojano, H Butzkueven, L Kappos, H Wiendl, T Spelman, F Pellegrini, ... Multiple sclerosis and related disorders 24, 11-19, 2018 | 20 | 2018 |
| Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning J Chen, T Lange, M Andjelkovic, A Simevski, L Lu, M Krstic IEEE Transactions on Emerging Topics in Computing 10 (2), 564-580, 2022 | 19 | 2022 |
| Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic Microelectronics Reliability 114, 113799, 2020 | 19 | 2020 |
| Understanding multidimensional verification: Where functional meets non-functional X Lai, A Balakrishnan, T Lange, M Jenihhin, T Ghasempouri, J Raik, ... Microprocessors and microsystems 71, 102867, 2019 | 18 | 2019 |
| A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ... 2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018 | 16 | 2018 |
| Composing graph theory and deep neural networks to evaluate seu type soft error effects A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2020 9th Mediterranean Conference on Embedded Computing (MECO), 1-5, 2020 | 15 | 2020 |
| Machine learning to tackle the challenges of transient and soft errors in complex circuits T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 14 | 2019 |
| A 500 MHz 16* 16 complex multiplier using self-aligned gate heterostructure FET technology T Akinwande, R MacTaggart, K Betz, D Grider, T Nohava, J Nohava, ... IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of …, 1989 | 14 | 1989 |
| On the estimation of complex circuits functional failure rate by machine learning techniques T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems …, 2019 | 13 | 2019 |
| Hardware accelerator design with supervised machine learning for solar particle event prediction J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic 2020 IEEE international symposium on defect and fault tolerance in VLSI and …, 2020 | 12 | 2020 |
| Machine learning clustering techniques for selective mitigation of critical design features T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 9 | 2020 |
| Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 72-78, 2019 | 9 | 2019 |
| The validation of graph model-based, gate level low-dimensional feature data for machine learning applications A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and …, 2019 | 8 | 2019 |
| A 500-MHz 16* 16 complex multiplier using self-aligned gate GaAs heterostructure FET technology AI Akinwande, IR MacTaggart, BK Betz, DE Grider, TH Lange, JC Nohava, ... IEEE journal of solid-state circuits 24 (5), 1295-1300, 1989 | 6 | 1989 |
| Functional failure rate due to single-event transients in clock distribution networks T Lange, M Glorieux, D Alexandrescu, L Sterpone 2019 14th International Conference on Design & Technology of Integrated …, 2019 | 5 | 2019 |
| Investigation of the Impact of Angles and Rotation of Low Energy Protons in SRAM Cells Down to 16nm L Artola, M Glorieux, G Hubert, C Inguimbert, T Bonnoit, R Rey, T Lange, ... IEEE Transactions on Nuclear Science, 2024 | 1 | 2024 |
| On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines X Lai, T Lange, A Balakrishnan, D Alexandrescu, M Jenihhin 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration …, 2021 | 1 | 2021 |
| Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis A Balakrishnan, D Alexandrescu, M Jenihhin, T Lange, M Glorieux 2021 22nd International Symposium on Quality Electronic Design (ISQED), 24-30, 2021 | 1 | 2021 |
| Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models D Alexandrescu, A Balakrishnan, T Lange, M Glorieux 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 1 | 2020 |
