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Sandrine Lhostis
Sandrine Lhostis
在 st.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Electrical behavior of phase-change memory cells based on GeTe
L Perniola, V Sousa, A Fantini, E Arbaoui, A Bastard, M Armand, ...
IEEE Electron Device Letters 31 (5), 488-490, 2010
1642010
Reliable 300 mm wafer level hybrid bonding for 3D stacked CMOS image sensors
S Lhostis, A Farcy, E Deloffre, F Lorut, S Mermoz, Y Henrion, L Berthier, ...
2016 IEEE 66th Electronic Components and Technology Conference (ECTC), 869-876, 2016
1132016
Carbon-doped GeTe: a promising material for phase-change memories
GB Beneventi, L Perniola, V Sousa, E Gourvest, S Maitrejean, JC Bastien, ...
Solid-State Electronics 65, 197-204, 2011
1032011
Hybrid bonding for 3D stacked image sensors: impact of pitch shrinkage on interconnect robustness
J Jourdon, S Lhostis, S Moreau, J Chossat, M Arnoux, C Sart, Y Henrion, ...
2018 IEEE International Electron Devices Meeting (IEDM), 7.3. 1-7.3. 4, 2018
792018
Impact of oxidation on Ge2Sb2Te5 and GeTe phase-change properties
E Gourvest, B Pelissier, C Vallée, A Roule, S Lhostis, S Maitrejean
Journal of The Electrochemical Society 159 (4), H373-H377, 2012
742012
Evidence of Germanium precipitation in phase-change thin films by Raman scattering
E Gourvest, S Lhostis, J Kreisel, M Armand, S Maitrejean, A Roule, ...
Applied Physics Letters 95 (3), 031908, 2009
582009
Comparative assessment of GST and GeTe materials for application to embedded phase-change memory devices
A Fantini, L Perniola, M Armand, JF Nodin, V Sousa, A Persico, J Cluzel, ...
2009 IEEE International Memory Workshop, 1-2, 2009
582009
Thin films of the double perovskite Sr2FeMoO6 deposited by pulsed laser deposition
RP Borges, S Lhostis, MA Bari, JJ Versluijs, JG Lunney, JMD Coey, ...
Thin Solid Films 429 (1-2), 5-12, 2003
552003
Thin films of the double perovskite Sr2FeMoO6 deposited by pulsed laser deposition
RP Borges, S Lhostis, MA Bari, JJ Versluijs, JG Lunney, JMD Coey, ...
Thin Solid Films 429 (1-2), 5-12, 2003
552003
Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared
JS Steckel, E Josse, AG Pattantyus-Abraham, M Bidaud, B Mortini, ...
2021 IEEE International Electron Devices Meeting (IEDM), 23.4. 1-23.4. 4, 2021
512021
1μm pitch direct hybrid bonding with< 300nm Wafer-to-Wafer overlay accuracy
A Jouve, V Balan, N Bresson, C Euvrard-Colnat, F Fournel, Y Exbrayat, ...
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2017
512017
Proximity sensor including reference detector for stray radiation detection
A Caley, PJ Parodi-Keravec, O Le Briz, S Lhostis
US Patent 9,535,157, 2017
502017
Pulsed liquid-injection MOCVD of high-K oxides for advanced semiconductor technologies
C Dubourdieu, H Roussel, C Jimenez, M Audier, JP Sénateur, S Lhostis, ...
Materials Science and Engineering: B 118 (1-3), 105-111, 2005
492005
Addition of yttrium into HfO2 films: Microstructure and electrical properties
C Dubourdieu, E Rauwel, H Roussel, F Ducroquet, B Holländer, ...
Journal of Vacuum Science & Technology A 27 (3), 503-514, 2009
452009
Observation of HfO2 thin films by deep UV spectroscopic ellipsometry
F Ferrieu, K Dabertrand, S Lhostis, V Ivanova, E Martinez, C Licitra, ...
Journal of Non-Crystalline Solids 353 (5-7), 658-662, 2007
452007
Theoretical and experimental study of a thermal damper based on a CNT/PCM composite structure for transient electronic cooling
C Kinkelin, S Lips, U Soupremanien, V Remondière, J Dijon, H Le Poche, ...
Energy conversion and management 142, 257-271, 2017
442017
Angular and polarization properties of cross-holes nanostructured metallic filters
R Girard-Desprolet, S Boutami, S Lhostis, G Vitrant
Optics express 21 (24), 29412-29424, 2013
402013
Chemical interface analysis of as grown HfO2 ultrathin films on SiO2
C Maunoury, K Dabertrand, E Martinez, M Saadoune, D Lafond, F Pierre, ...
Journal of applied physics 101 (3), 2007
362007
Hybrid bonding-based interconnects: A status on the last robustness and reliability achievements
S Moreau, J Jourdon, S Lhostis, D Bouchu, B Ayoub, L Arnaud, H Fremont
ECS Journal of Solid State Science and Technology 11 (2), 024001, 2022
352022
Cu/SiO2 hybrid bonding: Finite element modeling and experimental characterization
C Sart, R Estevez, V Fiori, S Lhostis, E Deloffre, G Parry, R Gonella
2016 6th Electronic System-Integration Technology Conference (ESTC), 1-7, 2016
342016
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