| Modeling of additive manufacturing processes for metals: Challenges and opportunities MM Francois, A Sun, WE King, NJ Henson, D Tourret, CA Bronkhorst, ... Current Opinion in Solid State and Materials Science 21 (4), 198-206, 2017 | 484 | 2017 |
| Time-varying network tomography: Router link data J Cao, D Davis, S Vander Wiel, B Yu Journal of the American statistical association 95 (452), 1063-1075, 2000 | 462 | 2000 |
| Algorithmic statistical process control: concepts and an application SA Vander Wiel, WT Tucker, FW Faltin, N Doganaksoy Technometrics 34 (3), 286-297, 1992 | 311 | 1992 |
| Estimating software fault content before coding SG Eick, CR Loader, MD Long, LG Votta, S Vander Wiel Proceedings of the 14th international conference on Software engineering, 59-65, 1992 | 220 | 1992 |
| Monitoring processes that wander using integrated moving average models SA Vander Wiel Technometrics 38 (2), 139-151, 1996 | 204 | 1996 |
| Algorithmic statistical process control: an elaboration WT Tucker, FW Faltin, SA Vander Wiel Technometrics 35 (4), 363-375, 1993 | 132 | 1993 |
| Assessing software designs using capture-recapture methods SA Vander Wiel, LG Votta IEEE Transactions on Software Engineering 19 (11), 1045-1054, 1993 | 119 | 1993 |
| Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests SA Vander Wiel, WQ Meeker IEEE Transactions on Reliability 39 (3), 346-351, 1990 | 85 | 1990 |
| The nonhomogeneous poisson process for fast radio burst rates E Lawrence, S Vander Wiel, C Law, SB Spolaor, GC Bower The Astronomical Journal 154 (3), 117, 2017 | 76 | 2017 |
| A scalable method for estimating network traffic matrices from link counts J Cao, SV Wiel, B Yu, Z Zhu Preprint. Available at http://stat-www. berkeley. edu/binyu/publications. html, 2000 | 64 | 2000 |
| How many errors remain in a software design document after inspection? SG Eick, CR Loader, SA Vander Wiel, LG Votta Computing science and statistics, 195-195, 1993 | 52 | 1993 |
| Line outage localization using phasor measurement data in transient state M Garcia, T Catanach, S Vander Wiel, R Bent, E Lawrence IEEE Transactions on Power Systems 31 (4), 3019-3027, 2015 | 44 | 2015 |
| Graph based statistical analysis of network traffic H Djidjev, G Sandine, C Storlie, S Vander Wiel Proceedings of the Ninth Workshop on Mining and Learning with Graphs, 2011 | 44 | 2011 |
| Monitoring networked applications with incremental quantile estimation JM Chambers, DA James, D Lambert, S Vander Wiel | 43 | 2006 |
| Enhancing nuclear data validation analysis by using machine learning D Neudecker, M Grosskopf, M Herman, W Haeck, P Grechanuk, ... Nuclear Data Sheets 167, 36-60, 2020 | 39 | 2020 |
| A discussion of all-or-none inspection policies SA Vander Wiel, SB Vardeman Technometrics 36 (1), 102-109, 1994 | 38 | 1994 |
| Algorithmic statistical process control: some practical observations FW Faltin, GJ Hahn, WT Tucker, SA Vander Wiel International Statistical Review/Revue Internationale de Statistique, 67-80, 1993 | 34 | 1993 |
| Method for estimating the traffic matrix of a communication network J Cao, RD Davis, SA Vander Wiel, B Yu US Patent 6,785,240, 2004 | 29 | 2004 |
| Stochastic identification of malware with dynamic traces C Storlie, B Anderson, SV Wiel, D Quist, C Hash, N Brown The Annals of Applied Statistics, 1-18, 2014 | 28 | 2014 |
| Design and evaluation of a fast and robust worm detection algorithm T Bu, A Chen, S Vander Wiel, T Woo Proceedings IEEE INFOCOM 2006. 25TH IEEE International Conference on …, 2006 | 28 | 2006 |
