| Controlling dendrite propagation in solid-state batteries with engineered stress CD Fincher, CE Athanasiou, C Gilgenbach, M Wang, BW Sheldon, ... Joule 6 (12), 2794-2809, 2022 | 66 | 2022 |
| Operando measurements of dendrite-induced stresses in ceramic electrolytes using photoelasticity CE Athanasiou, CD Fincher, C Gilgenbach, H Gao, WC Carter, ... Matter 7 (1), 95-106, 2024 | 8 | 2024 |
| Three-dimensional analysis of nanoscale dislocation loops with multislice electron ptychography C Gilgenbach, X Chen, M Xu, J LeBeau Microscopy and Microanalysis 29 (Supplement_1), 286-287, 2023 | 3 | 2023 |
| Characterization of quantum emitters and extended defects in ZnSe via multislice electron ptychography X Chen, C Gilgenbach, JM LeBeau Microscopy and Microanalysis 29 (Supplement_1), 342-343, 2023 | 1 | 2023 |
| Ionic Conduction-Based Polycrystalline Oxide Radiation-Ionic Detection Effects T Defferriere, C Gilgenbach, M Müller, JF Christian, J LeBeau, HL Tuller PRiME 2024 (October 6-11, 2024), 2024 | | 2024 |
| Direct Mechanical and Electrochemical Analysis of Dendrites in Solid-State Electrolytes CD Fincher, C Gilgenbach, R Osmundsen, C Roach, A Penn, ... PRiME 2024 (October 6-11, 2024), 2024 | | 2024 |
| Direct Quantification of Grain Boundary Space Charge Layers using Multislice Electron Ptychography C Gilgenbach, T Defferriere, HL Tuller, JM LeBeau Microscopy and Microanalysis 30 (Supplement_1), 2024 | | 2024 |
| Characterizing the 3D Polar Texture of Ferroelectric Relaxors using Multislice Electron Ptychography M Zhu, M Xu, C Gilgenbach, BR Denzer, JM LeBeau Microscopy and Microanalysis 30 (Supplement_1), 2024 | | 2024 |
| Stabilization of Antiferroelectric Nanodomains by Local Chemical Disorder Determined using Multislice Electron Ptychography M Xu, M Zhu, Y Yun, L Wu, O Shafir, C Gilgenbach, I Grinberg, JE Spanier, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 572, 2024 | | 2024 |
| Investigating Implantation Damage in Silicon Carbide Using ADF STEM and Multislice Ptychography A Bhat, J Kim, C Gilgenbach, J LeBeau Microscopy and Microanalysis 30 (Supplement_1), ozae044. 773, 2024 | | 2024 |
| Elucidating the Polar Structure of Twinned Domains in BiInO3 Using Electron Ptychography BR Denzer, D Kang, M Zhu, M Xu, C Gilgenbach, LW Martin, JM LeBeau Microscopy and Microanalysis 30 (Supplement_1), ozae044. 552, 2024 | | 2024 |
| A Methodology for Robust Multislice Ptychography C Gilgenbach, X Chen, JM LeBeau Microscopy and Microanalysis, ozae055, 2024 | | 2024 |
| Antiferroelectric Nanodomains Stabilized by Chemical Disorder at Anti-phase Boundaries M Zhu, M Xu, Y Yun, L Wu, O Shafir, C Gilgenbach, LW Martin, I Grinberg, ... arXiv preprint arXiv:2403.04904, 2024 | | 2024 |
| Sampling metrics for robust reconstructions in multislice ptychography: Theory and experiment C Gilgenbach, X Chen, JM LeBeau arXiv preprint arXiv:2311.15181, 2023 | | 2023 |
| Elucidating Structural Transition Dynamics in the Magnesium Cathode MgCr2O4 J Kim, S Anand, C Gilgenbach, ID Johnson, M Murphy, T Chen, M Moy, ... Chemistry of Materials 35 (20), 8455-8463, 2023 | | 2023 |
| Investigating Qubits in Silicon Carbide Using Multislice Electron Ptychography C Gilgenbach, A Bhat, J LeBeau Microscopy and Microanalysis 29 (Supplement_1), 1737-1737, 2023 | | 2023 |
Cole D. FincherMIT在 mit.edu 的电子邮件经过验证
![Menglin Zhu [ORCID: 0000-0001-6830-2636]](https://images.xueshu.lanfanshu.cn/citations?view_op=small_photo&user=tkEx8OQAAAAJ&citpid=4)
