Verification and testing considerations of an in-memory ai chip M Golmohamadi, R Jurasek, W Hokenmaier, D Labrecque, R Zhi, B Dale, ... 2020 IEEE 29th North Atlantic Test Workshop (NATW), 1-6, 2020 | 3 | 2020 |
Opportunities and Limitations of in-Memory Multiply-and-Accumulate Arrays R Zhi, R Jurasek, W Hokenmaier, D Labrecque, J Bucci, B Dale, N Islam, ... 2021 IEEE Microelectronics Design & Test Symposium (MDTS), 1-6, 2021 | | 2021 |