Measurement of nanometric displacements by correlating two speckle interferograms LP Tendela, GE Galizzi, A Federico, GH Kaufmann Applied Optics 50 (12), 1758-1764, 2011 | 18 | 2011 |
A fast method for measuring nanometric displacements by correlating speckle interferograms LP Tendela, GE Galizzi, A Federico, GH Kaufmann Optics and Lasers in Engineering 50 (2), 170-175, 2012 | 12 | 2012 |
Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier LP Tendela, GE Galizzi, A Federico, GH Kaufmann Optics and Lasers in Engineering 73, 16-21, 2015 | 8 | 2015 |
Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry LP Tendela, A Federico, GH Kaufmann Optics and lasers in engineering 49 (2), 281-284, 2011 | 7 | 2011 |
A novel approach for measuring nanometric displacements by correlating speckle interferograms LP Tendela, GE Galizzi Optics and Lasers in Engineering 110, 149-154, 2018 | 6 | 2018 |
Evaluation of coating adhesion using a radial speckle interferometer combined with a micro-indentation test LP Tendela, GH Kaufmann Optics and Lasers in Engineering 50 (6), 817-822, 2012 | 6 | 2012 |
In-Fiber All-Optical Fractional Differentiator Using an Asymmetrical Moiré Fiber Grating LP Tendela, CA Cuadrado-Laborde, MV Andrés Fractal and Fractional 7 (4), 291, 2023 | 4 | 2023 |
Buildup of Different Emission Regimes in a Nonlinear Polarization Rotation Modelocked All-Fiber Laser C CUADRADO-LABORDE, L Tendela, E Silvestre, A Diez, JL Cruz, ... Chaos, Solitons & Fractals: X, 100114, 2024 | 1 | 2024 |
Radial speckle interferometry combined with a microindentation test to analyze coating adhesion LP Tendela, MR Viotti, AA Gonçalves Jr, GH Kaufmann Speckle 2010: Optical Metrology 7387, 589-596, 2010 | 1 | 2010 |
Evaluation of a correlation phase recovery method to be used in temporal speckle pattern interferometry with noise contaminated specklegrams LP Tendela, GE Galizzi JOSA B 40 (4), C54-C59, 2023 | | 2023 |
Sign determination to measure non-monotonous displacements in temporal speckle pattern interferometry without a temporal carrier LP Tendela, GE Galizzi Optics and Lasers in Engineering 161, 107353, 2023 | | 2023 |
Sign determination in temporal speckle pattern interferometry without using a temporal carrier LP Tendela, GE Galizzi Óptica pura y aplicada 56 (2), 3, 2023 | | 2023 |