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Eric Nguyen
Eric Nguyen
在 stanford.edu 的电子邮件经过验证 - 首页
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Hyena hierarchy: Towards larger convolutional language models
M Poli, S Massaroli, E Nguyen, DY Fu, T Dao, S Baccus, Y Bengio, ...
International Conference on Machine Learning, 28043-28078, 2023
1762023
S4nd: Modeling images and videos as multidimensional signals with state spaces
E Nguyen, K Goel, A Gu, G Downs, P Shah, T Dao, S Baccus, C Ré
Advances in neural information processing systems 35, 2846-2861, 2022
1152022
Hyenadna: Long-range genomic sequence modeling at single nucleotide resolution
E Nguyen, M Poli, M Faizi, A Thomas, M Wornow, C Birch-Sykes, ...
Advances in neural information processing systems 36, 2023
1062023
Simple hardware-efficient long convolutions for sequence modeling
DY Fu, EL Epstein, E Nguyen, AW Thomas, M Zhang, T Dao, A Rudra, ...
International Conference on Machine Learning, 10373-10391, 2023
402023
Sequence modeling and design from molecular to genome scale with Evo
E Nguyen, M Poli, MG Durrant, AW Thomas, B Kang, J Sullivan, MY Ng, ...
BioRxiv, 2024.02. 27.582234, 2024
21*2024
Oscar-net: Object-centric scene graph attention for image attribution
E Nguyen, T Bui, V Swaminathan, J Collomosse
Proceedings of the IEEE/CVF international conference on computer vision …, 2021
162021
Mechanistic design and scaling of hybrid architectures
M Poli, AW Thomas, E Nguyen, P Ponnusamy, B Deiseroth, K Kersting, ...
arXiv preprint arXiv:2403.17844, 2024
92024
Flashfftconv: Efficient convolutions for long sequences with tensor cores
DY Fu, H Kumbong, E Nguyen, C Ré
arXiv preprint arXiv:2311.05908, 2023
82023
StripedHyena: Moving Beyond Transformers with Hybrid Signal Processing Models
M Poli, J Wang, S Massaroli, J Quesnelle, R Carlow, E Nguyen, A Thomas
72023
Robust content fingerprinting for image attribution
V Swaminathan, JP Collomosse, E Nguyen
US Patent App. 17/142,030, 2022
32022
Machine Learning for Genomics Explorations (MLGenX)
E Hajiramezanali, C Bunne, A Hasanzadeh, T Biancalani, E Nguyen, ...
ICLR 2024 Workshops, 0
Stool Classification Using Deep Metric Learning
E Nguyen, C Tech, C Kruger, S Erickson
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