| Embedded deterministic test for low cost manufacturing test J Rajski, J Tyszer, M Kassab, N Mukherjee, R Thompson, KH Tsai, ... Proceedings. International Test Conference, 301-310, 2002 | 483 | 2002 |
| Ring generators-new devices for embedded test applications G Mrugalski, J Rajski, J Tyszer IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004 | 125 | 2004 |
| Multi-stage test response compactors J Rajski, J Tyszer, G Mrugalski, M Kassab, WT Cheng US Patent 7,818,644, 2010 | 94 | 2010 |
| Low-power scan operation in test compression environment D Czysz, M Kassab, X Lin, G Mrugalski, J Rajski, J Tyszer IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 82 | 2009 |
| Low power scan shift and capture in the EDT environment D Czysz, M Kassab, X Lin, G Mrugalski, J Rajski, J Tyszer 2008 IEEE International Test Conference, 1-10, 2008 | 75 | 2008 |
| Compressing test responses using a compactor J Rajski, J Tyszer, C Wang, G Mrugalski, A Pogiel US Patent 7,370,254, 2008 | 73 | 2008 |
| New test data decompressor for low power applications G Mrugalski, J Rajski, D Czysz, J Tyszer Proceedings of the 44th annual Design Automation Conference, 539-544, 2007 | 72 | 2007 |
| Low power scan testing techniques and apparatus X Lin, D Czysz, M Kassab, G Mrugalski, J Rajski, J Tyszer US Patent 7,925,465, 2011 | 64 | 2011 |
| X-press compactor for 1000x reduction of test data J Rajski, J Tyszer, G Mrugalski, N Mukherjee, M Kassab 2006 IEEE International Test Conference, 1-10, 2006 | 63 | 2006 |
| Test generator with preselected toggling for low power built-in self-test J Rajski, J Tyszer, G Mrugalski, B Nadeau-Dostie 2012 IEEE 30th VLSI Test Symposium (VTS), 1-6, 2012 | 58 | 2012 |
| Deterministic clustering of incompatible test cubes for higher power-aware EDT compression D Czysz, G Mrugalski, N Mukherjee, J Rajski, P Szczerbicki, J Tyszer IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011 | 57 | 2011 |
| Low power decompression of test cubes J Rajski, G Mrugalski, D Czysz, J Tyszer US Patent 7,797,603, 2010 | 57 | 2010 |
| Low-power programmable PRPG with test compression capabilities M Filipek, G Mrugalski, N Mukherjee, B Nadeau-Dostie, J Rajski, J Solecki, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (6 …, 2014 | 50 | 2014 |
| X-Press: two-stage X-tolerant compactor with programmable selector J Rajski, J Tyszer, G Mrugalski, WT Cheng, N Mukherjee, M Kassab IEEE transactions on computer-aided design of integrated circuits and …, 2007 | 48 | 2007 |
| Decompressors for low power decompression of test patterns J Rajski, G Mrugalski, D Czysz, J Tyszer US Patent 7,647,540, 2010 | 46 | 2010 |
| Low-power test data application in EDT environment through decompressor freeze D Czysz, G Mrugalski, J Rajski, J Tyszer IEEE transactions on computer-aided design of integrated circuits and …, 2008 | 44 | 2008 |
| On compaction utilizing inter and intra-correlation of unknown states D Czysz, G Mrugalski, N Mukherjee, J Rajski, J Tyszer IEEE transactions on computer-aided design of integrated circuits and …, 2009 | 43 | 2009 |
| Fault diagnosis of compressed test responses having one or more unknown states J Rajski, G Mrugalski, A Pogiel, J Tyszer, C Wang US Patent 7,437,640, 2008 | 42 | 2008 |
| Generating masking control circuits for test response compactors J Rajski, J Tyszer, G Mrugalski, M Kassab US Patent App. 11/708,717, 2007 | 41 | 2007 |
| Low power embedded deterministic test D Czysz, G Mrugalski, J Rajski, J Tyszer 25th IEEE VLSI Test Symposium (VTS'07), 75-83, 2007 | 41 | 2007 |
