| Study of 100V GaN power devices in dynamic condition and GaN RF device performances in sub-6GHz frequencies G Giorgino, M Cioni, C Miccoli, L Gervasi, MFS Giuffrida, M Ruvolo, ... e-Prime-Advances in Electrical Engineering, Electronics and Energy 6, 100338, 2023 | 2 | 2023 |
| On-Wafer RON Degradation Analysis of 100 V p-GaN HEMTs Emulating Low- and High-Side Operation in Half Bridge Circuits L Modica, N Zagni, D Orlandini, M Cioni, G Cappellini, ME Castagna, ... 2024 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2024 | 1 | 2024 |
| Alternative Measurement Approach for the Evaluation of Hot-Electron Degradation in p-GaN Gate AlGaN/GaN Power HEMTs M Cioni, G Giorgino, A Chini, A Parisi, G Cappellini, C Miccoli, ... Electronic Materials 5 (3), 132-144, 2024 | 1 | 2024 |
| Impact of Gate and Drain Leakage on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs M Cioni, G Giorgino, A Chini, A Parisi, G Cappellini, L Modica, G Luongo, ... 2023 AEIT International Conference on Electrical and Electronic Technologies …, 2023 | 1 | 2023 |
| RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits N Zagni, L Modica, M Cioni, G Cappellini, ME Castagna, G Giorgino, ... 2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2024 | | 2024 |
| Preliminary Evaluation of PBTI and Back-Effect interplay in 100 V p-GaN gate AlGaN/GaN HEMTs G Cappellini, M Cioni, G Giorgino, A Chini, N Zagni, L Modica, G Luongo, ... 2024 15th International Conference on Advanced Semiconductor Devices and …, 2024 | | 2024 |
| On the dynamic RON, vertical leakage and capacitance behavior in pGaN HEMTs with heavily carbon-doped buffers M Cioni, A Chini, N Zagni, G Verzellesi, G Giorgino, G Cappellini, ... IEEE Electron Device Letters, 2024 | | 2024 |
| A novel measurement custom setup for on-wafer dynamic characterization of GaN HEMTs devices for power applications. G CAPPELLINI | | 2023 |
| Temperature Effect on RON-degradation induced by Off-state Drain Voltage Stress M Cioni, G Giorgino, G Cappellini, A Chini, C Miccoli, ME Castagna, ... Proc. of 46th Workshop on Compound Semiconductor Devices and Integrated …, 2023 | | 2023 |
| Improved High Temperature Behaviour of On-Resistance in 100V p-GaN HEMTs G Giorgino, M Cioni, G Cappellini, F Iucolano, C Miccoli, ME Castagna, ... Proc. of 46th Workshop on Compound Semiconductor Devices and Integrated …, 2023 | | 2023 |
