Ceramic injection molding Z Stanimirović, I Stanimirović Some Critical Issues for Injection Molding, 131-148, 2012 | 31 | 2012 |
Evaluation of thick-film resistor structural parameters based on noise index measurements MM Jevtić, Z Stanimirović, I Stanimirović Microelectronics Reliability 41 (1), 59-66, 2001 | 29 | 2001 |
High-voltage pulse stressing of thick-film resistors and noise I Stanimirović, MM Jevtić, Z Stanimirović Microelectronics Reliability 43 (6), 905-911, 2003 | 26 | 2003 |
Low-frequency noise in thick-film structures caused by traps in glass barriers I Mrak, MM Jevtić, Z Stanimirović Microelectronics Reliability 38 (10), 1569-1576, 1998 | 25 | 1998 |
Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell MM Jevtic, Z Stanimirovic, I Mrak IEEE Transactions on Components and Packaging Technologies 22 (1), 120-125, 1999 | 24 | 1999 |
Mechanical properties of MEMS materials Z Stanimirović, I Stanimirović Micro Electronic and Mechanical Systems 35, L74, 2009 | 23 | 2009 |
Thick-film resistor quality indicator based on noise index measurements MM Jevtić, I Mrak, Z Stanimirović Microelectronics journal 30 (12), 1255-1259, 1999 | 22 | 1999 |
Simultaneous mechanical and electrical straining of conventional thick-film resistors Z Stanimirović, MM Jevtić, I Stanimirović Microelectronics Reliability 48 (1), 59-67, 2008 | 18 | 2008 |
Effects of high voltage pulse trimming on structural properties of thick-film resistors Z Stanimirović, I Stanimirović Science of Sintering 49 (1), 91-98, 2017 | 14 | 2017 |
Multiple high-voltage pulse stressing of conventional thick-film resistors I Stanimirović, MM Jevtić, Z Stanimirović Microelectronics Reliability 47 (12), 2242-2248, 2007 | 14 | 2007 |
Computer simulation of thick-film resistors based on 3D planar RRN model Z Stanimirovic, MM Jevtic, I Stanimirovic EUROCON 2005-The International Conference on" Computer as a Tool" 2, 1687-1690, 2005 | 13 | 2005 |
Use neural network in photoacoustic measurement of thermoelastic properties of aluminum foil КL Djordjević, SP Galović, MN Popović, MV Nešić, IP Stanimirović, ... Measurement 199, 111537, 2022 | 12 | 2022 |
Influence of HVP trimming on primary parameters of thick resistive films I Stanimirović, Z Stanimirović Journal of Materials Science: Materials in Electronics 28 (11), 8002-8010, 2017 | 10 | 2017 |
Reliability of MEMS I Stanimirovic, Z Stanimirovic Microelectronics Reliability 43 (7), 1047-1048, 2011 | 10 | 2011 |
The response of a heat loss flowmeter in a water pipe under changing flow conditions OS Aleksić, MV Nikolić, MD Luković, ZI Stanimirović, IP Stanimirović, ... IEEE Sensors Journal 16 (9), 2935-2941, 2016 | 8 | 2016 |
Optical MEMS for telecommunications: some reliability issues I Stanimirović, Z Stanimirović Advances in Micro/Nano Electromechanical Systems and Fabrication Technologies, 2013 | 7 | 2013 |
Thick-Film Technology for Energy Harvesting Z Stanimirović, I Stanimirović Zbornik Međunarodne konferencije o obnovljivim izvorima električne energije …, 2018 | 5 | 2018 |
Temperature Sensing I Stanimirović, Z Stanimirović BoD–Books on Demand, 2018 | 5 | 2018 |
Mechanical characterization of MEMS materials Z Stanimirović, I Stanimirović 2012 28th International Conference on Microelectronics Proceedings, 177-179, 2012 | 5 | 2012 |
Injection molded Mn-Zn ferrite ceramics Z Stanimirović, I Stanimirović 2010 27th International Conference on Microelectronics Proceedings, 227-229, 2010 | 5 | 2010 |