| Direct growth of III–V/silicon triple-junction solar cells with 19.7% efficiency M Feifel, J Ohlmann, J Benick, M Hermle, J Belz, A Beyer, K Volz, ... IEEE Journal of Photovoltaics 8 (6), 1590-1595, 2018 | 73 | 2018 |
| MOVPE grown gallium phosphide–silicon heterojunction solar cells M Feifel, J Ohlmann, J Benick, T Rachow, S Janz, M Hermle, F Dimroth, ... IEEE Journal of Photovoltaics 7 (2), 502-507, 2017 | 72 | 2017 |
| STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens JO Oelerich, L Duschek, J Belz, A Beyer, SD Baranovskii, K Volz Ultramicroscopy 177, 91-96, 2017 | 62 | 2017 |
| Anisotropic relaxation behavior of InGaAs/GaAs selectively grown in narrow trenches on (001) Si substrates W Guo, Y Mols, J Belz, A Beyer, K Volz, A Schulze, R Langer, B Kunert Journal of Applied Physics 122 (2), 2017 | 26 | 2017 |
| Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging A Beyer, J Belz, N Knaub, K Jandieri, K Volz Ultramicroscopy 169, 1-10, 2016 | 21 | 2016 |
| Local sample thickness determination via scanning transmission electron microscopy defocus series A Beyer, R Straubinger, J Belz, K Volz Journal of Microscopy 262 (2), 171-177, 2016 | 20 | 2016 |
| Influence of surface relaxation of strained layers on atomic resolution ADF imaging A Beyer, L Duschek, J Belz, JO Oelerich, K Jandieri, K Volz Ultramicroscopy 181, 8-16, 2017 | 18 | 2017 |
| Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning J Belz, A Beyer, T Torunski, W Stolz, K Volz Ultramicroscopy 163, 19-30, 2016 | 17 | 2016 |
| Surface relaxation of strained Ga (P, As)/GaP heterostructures investigated by HAADF STEM A Beyer, L Duschek, J Belz, JO Oelerich, K Jandieri, K Volz Journal of Microscopy 268 (3), 239-247, 2017 | 12 | 2017 |
| Quantitative atomic resolution at interfaces: Subtraction of the background in STEM images with the example of (Ga, In) P/GaAs structures H Han, A Beyer, J Belz, A König, W Stolz, K Volz Journal of Applied Physics 121 (2), 2017 | 11 | 2017 |
| Thermally Introduced Bismuth Clustering in Ga(P,Bi) Layers under Group V Stabilised Conditions Investigated by Atomic Resolution In Situ (S)TEM R Straubinger, M Widemann, J Belz, L Nattermann, A Beyer, K Volz Scientific Reports 8 (1), 9048, 2018 | 10 | 2018 |
| Three-dimensional structure of antiphase domains in GaP on Si (0 0 1) P Farin, M Marquardt, W Martyanov, J Belz, A Beyer, K Volz, A Lenz Journal of Physics: Condensed Matter 31 (14), 144001, 2019 | 9 | 2019 |
| Atomic-scale 3D reconstruction of antiphase boundaries in GaP on (001) silicon by STEM J Belz, A Beyer, K Volz Micron 114, 32-41, 2018 | 7 | 2018 |
| Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM VS Chejarla, S Ahmed, J Belz, J Scheunert, A Beyer, K Volz Small Methods 7 (9), 2300453, 2023 | 5 | 2023 |
| Octave-spanning emission across the visible spectrum from single crystalline 1, 3, 5, 7-tetrakis-(p-methoxyphenyl) adamantane MJ Müller, F Ziese, J Belz, F Hüppe, S Gowrisankar, B Bernhardt, ... Optical Materials Express 12 (9), 3517-3529, 2022 | 5 | 2022 |
| White Light Generating Molecular Materials: Correlation Between the Amorphous/Crystalline Structure and Nonlinear Optical Properties J Haust, J Belz, M Müller, B Danilo Klee, J Link Vasco, F Hüppe, ... ChemPhotoChem 6 (6), e202200071, 2022 | 5 | 2022 |
| Measuring interatomic bonding and charge redistributions in defects by combining 4D-STEM and STEM multislice simulations D Heimes, J Belz, A Beyer, K Volz Microscopy and Microanalysis 26 (S2), 452-454, 2020 | 2 | 2020 |
| Structure determination in a new type of amorphous molecular solids with different nonlinear optical properties: a comparative structural analysis JL Vasco, JR Stellhorn, BD Klee, B Paulus, J Belz, J Haust, S Hosokawa, ... Journal of Physics: Condensed Matter 35 (38), 384001, 2023 | 1 | 2023 |
| On The Effects of Column Occupancy and Static Atomic Disorder on the Analysis of Chemical Ordering in Ga (P (1-x) Bix) Compounds J Belz, A Beyer, L Nattermann, K Volz Microscopy and Microanalysis 23 (S1), 1474-1475, 2017 | 1 | 2017 |
| Correlation of interface morphology and composition in GaInP/GaAs with growth conditions H Han, A Beyer, J Belz, A König, W Stolz, K Volz European Microscopy Congress 2016: Proceedings, 573-574, 2016 | 1 | 2016 |
