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Dong Pan
标题
引用次数
引用次数
年份
Temperature measurement and compensation method of blast furnace molten iron based on infrared computer vision
D Pan, Z Jiang, Z Chen, W Gui, Y Xie, C Yang
IEEE Transactions on Instrumentation and Measurement 68 (10), 3576-3588, 2018
892018
Soft sensors based on adaptive stacked polymorphic model for silicon content prediction in ironmaking process
Y Fang, Z Jiang, D Pan, W Gui, Z Chen
IEEE Transactions on Instrumentation and Measurement 70, 1-12, 2020
422020
Abnormality monitoring in the blast furnace ironmaking process based on stacked dynamic target-driven denoising autoencoders
K Jiang, Z Jiang, Y Xie, D Pan, W Gui
IEEE transactions on industrial informatics 18 (3), 1854-1863, 2021
412021
A novel MAS-GAN-based data synthesis method for object surface defect detection
H Zhang, D Pan, J Liu, Z Jiang
Neurocomputing 499, 106-114, 2022
352022
Classification of silicon content variation trend based on fusion of multilevel features in blast furnace ironmaking
K Jiang, Z Jiang, Y Xie, Z Chen, D Pan, W Gui
Information Sciences 521, 32-45, 2020
322020
Compensation method for molten iron temperature measurement based on heterogeneous features of infrared thermal images
D Pan, Z Jiang, Z Chen, K Jiang, W Gui
IEEE Transactions on Industrial Informatics 16 (11), 7056-7066, 2020
302020
Temperature measurement method for blast furnace molten iron based on infrared thermography and temperature reduction model
D Pan, Z Jiang, Z Chen, W Gui, Y Xie, C Yang
Sensors 18 (11), 3792, 2018
282018
Prediction of multiple molten iron quality indices in the blast furnace ironmaking process based on attention-wise deep transfer network
K Jiang, Z Jiang, Y Xie, D Pan, W Gui
IEEE Transactions on Instrumentation and Measurement 71, 1-14, 2022
252022
Compensation method for the influence of dust in optical path on infrared temperature measurement
D Pan, Z Jiang, W Gui, K Jiang, X Maldague
IEEE Transactions on Instrumentation and Measurement 70, 1-11, 2020
242020
Research on the influence of multiple interference factors on infrared temperature measurement
D Pan, Z Jiang, X Maldague, W Gui
IEEE Sensors Journal 21 (9), 10546-10555, 2021
232021
Polymorphic measurement method of FeO content of sinter based on heterogeneous features of infrared thermal images
Z Jiang, Y Guo, D Pan, W Gui, X Maldague
IEEE Sensors Journal 21 (10), 12036-12047, 2021
202021
Influence of dust on temperature measurement using infrared thermal imager
D Pan, Z Jiang, W Gui, X Maldague, K Jiang
IEEE Sensors Journal 20 (6), 2911-2918, 2019
192019
Temperature measurement of molten iron in taphole of blast furnace combined temperature drop model with heat transfer model
ZH Jiang, D Pan, WH Gui, YF Xie, CH Yang
Ironmaking & Steelmaking 45 (3), 230-238, 2018
192018
Depth estimation from a single image of blast furnace burden surface based on edge defocus tracking
J Huang, Z Jiang, W Gui, Z Yi, D Pan, K Zhou, C Xu
IEEE Transactions on Circuits and Systems for Video Technology 32 (9), 6044-6057, 2022
172022
A novel method for compensating temperature measurement error caused by dust using infrared thermal imager
D Pan, Z Jiang, Z Chen, W Gui, Y Xie, C Yang
IEEE Sensors Journal 19 (5), 1730-1739, 2018
172018
CSDM: A cross-scale decomposition method for low-light image enhancement
B Yang, D Pan, Z Jiang, J Huang, W Gui
Signal Processing 202, 108752, 2023
102023
Influence of charging parameters on the burden flow velocity and distribution on the blast furnace chute based on discrete element method
K Zhou, Z Jiang, D Pan, W Gui, J Huang
steel research international 93 (1), 2100332, 2022
102022
Detail-aware near infrared and visible fusion with multi-order hyper-Laplacian priors
B Yang, Z Jiang, D Pan, H Yu, W Gui
Information Fusion 99, 101851, 2023
92023
Soft sensor modeling method based on target-guided related feature learning and its application
Z Jiang, J Zhu, D Pan, H Yu, W Gui, K Zhou
IEEE Transactions on Instrumentation and Measurement 71, 1-14, 2022
82022
Polymorphic temperature measurement method of molten iron after skimmer in ironmaking process
D Pan, Z Jiang, C Xu, W Gui
IEEE Transactions on Instrumentation and Measurement 71, 1-11, 2022
72022
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