| Towards understanding recovery of hot-carrier induced degradation MJ de Jong, C Salm, J Schmitz Microelectronics reliability 88, 147-151, 2018 | 18 | 2018 |
| Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs MJ de Jong, C Salm, J Schmitz Microelectronics reliability 76, 136-140, 2017 | 14 | 2017 |
| Recovery after hot-carrier injection: Slow versus fast traps MJ de Jong, C Salm, J Schmitz Microelectronics Reliability 100, 113318, 2019 | 9 | 2019 |
| Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material AEM Smink, MJ de Jong, H Hilgenkamp, WG Van Der Wiel, J Schmitz 2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020 | 2 | 2020 |
| Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices MJ De Jong, C Salm, J Schmitz 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 1 | 2020 |
| Recovery of hot-carrier degraded nMOSFETs MJ de Jong | | 2022 |
