| Application of electrochemical impedance spectroscopy to commercial Li-ion cells: A review N Meddings, M Heinrich, F Overney, JS Lee, V Ruiz, E Napolitano, S Seitz, ... Journal of Power Sources 480, 228742, 2020 | 564 | 2020 |
| $ RLC $ bridge based on an automated synchronous sampling system F Overney, B Jeanneret IEEE Transactions on Instrumentation and Measurement 60 (7), 2393-2398, 2011 | 75 | 2011 |
| Characterization of metrological grade analog-to-digital converters using a programmable Josephson voltage standard F Overney, A Rufenacht, JP Braun, B Jeanneret, PS Wright IEEE Transactions on Instrumentation and Measurement 60 (7), 2172-2177, 2011 | 71 | 2011 |
| Josephson-based full digital bridge for high-accuracy impedance comparisons F Overney, NE Flowers-Jacobs, B Jeanneret, A Rüfenacht, AE Fox, ... Metrologia 53 (4), 1045, 2016 | 63 | 2016 |
| Realization of an inductance scale traceable to the quantum Hall effect using an automated synchronous sampling system F Overney, B Jeanneret Metrologia 47 (6), 690, 2010 | 54 | 2010 |
| Josephson-voltage-standard-locked sine wave synthesizer: Margin evaluation and stability B Jeanneret, F Overney, L Callegaro, A Mortara, A Rufenacht IEEE Transactions on Instrumentation and Measurement 58 (4), 791-796, 2008 | 48 | 2008 |
| Impedance bridges: from Wheatstone to Josephson F Overney, B Jeanneret Metrologia 55 (5), S119, 2018 | 42 | 2018 |
| GPS time transfer using geodetic receivers: Middle-term stability and temperature dependence of the signal delays F Overney, T Schildknecht, G Beutler, L Prost, U Feller Proc. 11th European Frequency and Time Forum, 504-508, 1997 | 40 | 1997 |
| Compendium for precise ac measurements of the quantum Hall resistance FJ Ahlers, B Jeanneret, F Overney, J Schurr, BM Wood Metrologia 46 (5), R1, 2009 | 39 | 2009 |
| GPS time-transfer using geodetic receivers (GeTT): Results on European baselines F Overney, L Prost, G Dudle, T Schildknecht, G Beutler, J Davis, J Furlong, ... Proc. 12th European Frequency Time Forum, 94-99, 1998 | 37 | 1998 |
| An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS M Ortolano, L Palafox, J Kučera, L Callegaro, V D’Elia, M Marzano, ... Metrologia 55 (4), 499, 2018 | 35 | 2018 |
| The quantized Hall resistance: towards a primary standard of impedance F Overney, B Jeanneret, B Jeckelmann, BM Wood, J Schurr Metrologia 43 (5), 409, 2006 | 35 | 2006 |
| High precision comparison between a programmable and a pulse-driven Josephson voltage standard B Jeanneret, A Rüfenacht, F Overney, H van den Brom, E Houtzager Metrologia 48 (5), 311, 2011 | 32 | 2011 |
| Thermal-transfer standard validation of the Josephson-voltage-standard-locked sine-wave synthesizer A Rufenacht, F Overney, A Mortara, B Jeanneret IEEE Transactions on Instrumentation and Measurement 60 (7), 2372-2377, 2011 | 32 | 2011 |
| Restoring the electrical properties of CVD graphene via physisorption of molecular adsorbates K Thodkar, D Thompson, F Lüönd, L Moser, F Overney, L Marot, ... ACS applied materials & interfaces 9 (29), 25014-25022, 2017 | 31 | 2017 |
| Dual Josephson impedance bridge: towards a universal bridge for impedance metrology F Overney, NE Flowers-Jacobs, B Jeanneret, A Rüfenacht, AE Fox, ... Metrologia 57 (6), 065014, 2020 | 29 | 2020 |
| The European ACQHE project: Modular system for the calibration of capacitance standards based on the quantum Hall effect J Melcher, J Schurr, K Pierz, JM Williams, SP Giblin, F Cabiati, ... IEEE Transactions on Instrumentation and Measurement 52 (2), 563-568, 2003 | 29 | 2003 |
| Broadband fully automated digitally assisted coaxial bridge for high accuracy impedance ratio measurements F Overney, F Lüönd, B Jeanneret Metrologia 53 (3), 918, 2016 | 28 | 2016 |
| Optimization of QHE-devices for metrological applications B Jeckelmann, A Rufenacht, B Jeanneret, F Overney, K Pierz, ... IEEE Transactions on Instrumentation and Measurement 50 (2), 218-222, 2001 | 26 | 2001 |
| Effects of metallic gates on AC measurements of the quantum Hall resistance F Overney, B Jeanneret, B Jeckelmann IEEE Transactions on Instrumentation and Measurement 52 (2), 574-578, 2003 | 25 | 2003 |
