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Jun Chen
Jun Chen
在 nims.go.jp 的电子邮件经过验证
标题
引用次数
引用次数
年份
Electron-beam-induced current study of grain boundaries in multicrystalline silicon
J Chen, T Sekiguchi, D Yang, F Yin, K Kido, S Tsurekawa
Journal of Applied Physics 96 (10), 5490-5495, 2004
3012004
Carrier recombination activity and structural properties of small-angle grain boundaries in multicrystalline silicon
J Chen, T Sekiguchi
Japanese Journal of Applied Physics 46 (10R), 6489, 2007
1282007
Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon
J Chen, T Sekiguchi, R Xie, P Ahmet, T Chikyo, D Yang, S Ito, F Yin
Scripta Materialia 52 (12), 1211-1215, 2005
1282005
Recombination activity of Σ3 boundaries in boron-doped multicrystalline silicon: Influence of iron contamination
J Chen, D Yang, Z Xi, T Sekiguchi
Journal of applied physics 97 (3), 2005
1122005
Segregation behaviors and radial distribution of dopant atoms in silicon nanowires
N Fukata, S Ishida, S Yokono, R Takiguchi, J Chen, T Sekiguchi, ...
Nano letters 11 (2), 651-656, 2011
872011
Doping and hydrogen passivation of boron in silicon nanowires synthesized by laser ablation
N Fukata, J Chen, T Sekiguchi, N Okada, K Murakami, T Tsurui, S Ito
Applied physics letters 89 (20), 2006
702006
Structural characterization and iron detection at Σ3 grain boundaries in multicrystalline silicon
B Chen, J Chen, T Sekiguchi, M Saito, K Kimoto
Journal of Applied Physics 105 (11), 2009
632009
Electron-beam-induced current study of stacking faults and partial dislocations in 4H-SiC Schottky diode
B Chen, J Chen, T Sekiguchi, T Ohyanagi, H Matsuhata, A Kinoshita, ...
Applied Physics Letters 93 (3), 2008
592008
Phosphorus doping and hydrogen passivation of donors and defects in silicon nanowires synthesized by laser ablation
N Fukata, J Chen, T Sekiguchi, S Matsushita, T Oshima, N Uchida, ...
Applied physics letters 90 (15), 2007
592007
Electron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contamination
J Chen, D Yang, Z Xi, T Sekiguchi
Physica B: Condensed Matter 364 (1-4), 162-169, 2005
562005
Texturization of cast multicrystalline silicon for solar cells
Z Xi, D Yang, W Dan, C Jun, X Li, D Que
Semiconductor science and technology 19 (3), 485, 2004
502004
Correlation between residual strain and electrically active grain boundaries in multicrystalline silicon
J Chen, B Chen, T Sekiguchi, M Fukuzawa, M Yamada
Applied Physics Letters 93 (11), 2008
422008
The characterization of high quality multicrystalline silicon by the electron beam induced current method
J Chen, T Sekiguchi, S Nara, D Yang
Journal of Physics: Condensed Matter 16 (2), S211, 2003
422003
Codoping of boron and phosphorus in silicon nanowires synthesized by laser ablation
N Fukata, M Mitome, Y Bando, M Seoka, S Matsushita, K Murakami, ...
Applied physics letters 93 (20), 2008
412008
Cathodoluminescene study of Mg implanted GaN: the impact of dislocation on Mg diffusion
J Chen, W Yi, T Kimura, S Takashima, M Edo, T Sekiguchi
Applied Physics Express 12 (5), 051010, 2019
362019
Grain growth of cast-multicrystalline silicon grown from small randomly oriented seed crystal
RR Prakash, T Sekiguchi, K Jiptner, Y Miyamura, J Chen, H Harada, ...
Journal of crystal growth 401, 717-719, 2014
362014
High quality multicrystalline silicon grown by multi-stage solidification control method
S Nara, T Sekiguchi, J Chen
The European Physical Journal Applied Physics 27 (1-3), 389-392, 2004
352004
Crystal growth of 50 cm square mono-like Si by directional solidification and its characterization
Y Miyamura, H Harada, K Jiptner, J Chen, RR Prakash, S Nakano, B Gao, ...
Journal of crystal growth 401, 133-136, 2014
302014
Influence of implanted Mg concentration on defects and Mg distribution in GaN
A Kumar, W Yi, J Uzuhashi, T Ohkubo, J Chen, T Sekiguchi, R Tanaka, ...
Journal of Applied Physics 128 (6), 2020
232020
Grain boundary interactions in multicrystalline silicon grown from small randomly oriented seeds
RR Prakash, K Jiptner, J Chen, Y Miyamura, H Harada, T Sekiguchi
Applied Physics Express 8 (3), 035502, 2015
232015
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