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Sebastian Schermer
Sebastian Schermer
其他姓名S. Schermer
Fraunhofer ENAS
在 enas.fraunhofer.de 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Impact of dielectric and copper via design on wafer-to-wafer hybrid bonding
V Dubey, D Wünsch, K Gottfried, M Wiemer, T Fischer, S Schermer, ...
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 795-799, 2023
122023
Process and Design Challenges for Hybrid Bonding
V Dubey, D Wünsch, K Gottfried, M Wiemer, T Fischer, A Hanisch, ...
Ecs Transactions 112 (3), 73, 2023
72023
Intra-level mix and match lithography with electron beam lithography and i-line stepper combined with resolution enhancement for structures below the CD-limit
C Helke, CH Canpolat-Schmidt, G Heldt, S Schermer, S Hartmann, ...
Micro and Nano Engineering 19, 100189, 2023
32023
Development of an e-beam/i-line stepper intra-level mix and match approach with the photoresist mr-EBL 6000.5 for PIC related structures such as waveguides, ring resonators and …
M Reinhardt, C Helke, S Schermer, S Hartmann, A Voigt, D Reuter
38th European Mask and Lithography Conference (EMLC 2023) 12802, 142-149, 2023
22023
2.5 D-patterning via i-line grayscale exposure for photonic structures and micro lens arrays
S Schermer, C Helke, B Sake, A Zanzal, P Reynolds, S DeMoor, A Voigt, ...
Novel Patterning Technologies 2024 12956, 147-152, 2024
12024
Aluminum-nitride-based modular photonic integrated circuit technology and characterization platform (PIC-TCP)
F Tank, J Wecker, C Stöckel, C Helke, S Schermer, A Shaporin, K Hiller, ...
Integrated Optics: Devices, Materials, and Technologies XXVIII 12889, 51-56, 2024
12024
High-resolution projection lithography for MEMS-applications using thick photoresist AZ 10XT
S Schermer, C Helke, D Song, D Reuter, H Kuhn
2022 Smart Systems Integration (SSI), 1-5, 2022
12022
Scalable fabrication approach and fill factor optimization for single pixel microlens arrays
J Bonitz, C Helke, N Dittmar, S Schermer, M Haase, L Hofmann, D Reuter
Journal of Vacuum Science & Technology B 42 (6), 2024
2024
Characterization of negative tone photoresist mr-EBL 6000.5 for i-line stepper and electron beam lithography for the Intra-Level Mix & Match Approach
S Schermer, C Helke, M Reinhardt, S Hartmann, F Tank, J Wecker, ...
Micro and Nano Engineering, 100264, 2024
2024
Advancing Fine Pitch (< 5μm) Interconnects through Self-Aligned Die-to-Wafer Hybrid Bonding for Chiplet Integration
V Dubey, D Wünsch, K Gottfried, R Kinner, R Suroshe, M Küchler, ...
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC), 469-473, 2023
2023
Modelling and process development of ceramic heat transfer layers for ignition of integrated reactive multilayer systems
K Vogel, S Schermer, C Helke, S Zimmermann, D Reuter
MikroSystemTechnik Kongress 2023; Kongress, 441-444, 2023
2023
Micro and Nano Engineering
C Helke, CH Canpolat-Schmidt, G Heldt, S Schermer, S Hartmann, ...
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