| Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser KN Joo, SW Kim Optics express 14 (13), 5954-5960, 2006 | 347 | 2006 |
| Distance measurements by combined method based on a femtosecond pulse laser KN Joo, Y Kim, SW Kim Optics express 16 (24), 19799-19806, 2008 | 151 | 2008 |
| High resolution heterodyne interferometer without detectable periodic nonlinearity KN Joo, JD Ellis, ES Buice, JW Spronck, RHM Schmidt Optics express 18 (2), 1159-1165, 2010 | 119 | 2010 |
| Simple heterodyne laser interferometer with subnanometer periodic errors KN Joo, JD Ellis, JW Spronck, PJM van Kan, RHM Schmidt Optics letters 34 (3), 386-388, 2009 | 80 | 2009 |
| Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser KN Joo, SW Kim Optics letters 32 (6), 647-649, 2007 | 58 | 2007 |
| Low cost wafer metrology using a NIR low coherence interferometry YG Kim, YB Seo, KN Joo Optics express 21 (11), 13648-13655, 2013 | 29 | 2013 |
| A compact high-precision periodic-error-free heterodyne interferometer KN Joo, E Clark, Y Zhang, JD Ellis, F Guzmán JOSA A 37 (9), B11-B18, 2020 | 27 | 2020 |
| High-speed combined NIR low-coherence interferometry for wafer metrology HM Park, KN Joo Applied Optics 56 (31), 8592-8597, 2017 | 24 | 2017 |
| Frequency stabilized three mode HeNe laser using nonlinear optical phenomena JD Ellis, KN Joo, ES Buice, JW Spronck Optics Express 18 (2), 1373-1379, 2010 | 21 | 2010 |
| Single-shot freeform surface profiler YB Seo, HB Jeong, HG Rhee, YS Ghim, KN Joo Optics Express 28 (3), 3401-3409, 2020 | 20 | 2020 |
| SPARSE (spatially phase-retarded spectroscopic ellipsometry) for real-time film analysis DH Kim, YH Yun, KN Joo Optics letters 42 (16), 3189-3192, 2017 | 19 | 2017 |
| Optical interferometric approach for measuring the geometrical dimension and refractive index profiles of a double-sided polished undoped Si wafer HJ Lee, KN Joo Measurement Science and Technology 25 (7), 075202, 2014 | 19 | 2014 |
| Dual low coherence scanning interferometry for rapid large step height and thickness measurements HM Park, HW Jung, KN Joo Optics Express 24 (25), 28625-28632, 2016 | 18 | 2016 |
| 3D multi-layered film thickness profile measurements based on photometric type imaging ellipsometry YB Seo, YH Yun, KN Joo International Journal of Precision Engineering and Manufacturing 17, 989-993, 2016 | 17 | 2016 |
| Dichroic spectrally-resolved interferometry to overcome the measuring range limit KN Joo Measurement Science and Technology 26 (9), 095204, 2015 | 17 | 2015 |
| Vision chromatic confocal sensor based on a geometrical phase lens HM Park, U Kwon, KN Joo Applied Optics 60 (10), 2898-2901, 2021 | 16 | 2021 |
| Design of a folded, multi-pass Fabry–Perot cavity for displacement metrology KN Joo, JD Ellis, JW Spronck, RHM Schmidt Measurement Science and Technology 20 (10), 107001, 2009 | 16 | 2009 |
| Single-shot imaging of two-wavelength spatial phase-shifting interferometry JW Jeon, KN Joo Sensors 19 (23), 5094, 2019 | 15 | 2019 |
| High-speed polarized low coherence scanning interferometry based on spatial phase shifting JW Jeon, HW Jeong, HB Jeong, KN Joo Applied Optics 58 (20), 5360-5365, 2019 | 15 | 2019 |
| Fiber-based two-wavelength heterodyne laser interferometer Y Zhang, F Guzman Optics Express 30 (21), 37993-38008, 2022 | 14 | 2022 |
