| Afe-cim: A current-domain compute-in-memory macro for analog-to-feature extraction S Sharma, WC Wang, C DeLude, M Lee, NM Rahman, NV Kidambi, ... ESSCIRC 2023-IEEE 49th European Solid State Circuits Conference (ESSCIRC), 33-36, 2023 | 10 | 2023 |
| A novel complementary architecture of one-time-programmable memory and its applications as physical unclonable function (PUF) and one-time password WC Wang, CC Chuang, CW Chang, ER Hsieh, HW Chen, SS Chung 2020 IEEE International Electron Devices Meeting (IEDM), 31.6. 1-31.6. 4, 2020 | 8 | 2020 |
| Cool-cim: Cryogenic operation of analog compute-in-memory for improved power-efficiency WC Wang, R Saligram, S Sharma, M Lee, A Gaidhane, Y Cao, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | 4 | 2023 |
| BeamCIM: A Compute-In-Memory based Broadband Beamforming Accelerator using Linear Embedding NM Rahman, S Sharma, C DeLude, WC Wang, J Romberg, ... 2024 IEEE Radio and Wireless Symposium (RWS), 46-49, 2024 | 3 | 2024 |
| Energy-efficient sensor platform using reliable analog-to-feature extraction M Lee, S Sharma, WC Wang, S Mukhopadhyay 2023 IEEE SENSORS, 1-4, 2023 | 1 | 2023 |
| Analysis of Effects of Aging on the Accuracy of Analog Computing-In-Memory Computation S Zhang, WC Wang, S Sharma, S Mukhopadhyay 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2023 | 1 | 2023 |
| Cryogenic Operation of Computing-In-Memory based Spiking Neural Network LA Shamieh, WC Wang, S Zhang, R Saligram, AD Gaidhane, Y Cao, ... Proceedings of the 29th ACM/IEEE International Symposium on Low Power …, 2024 | | 2024 |
| Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm S Zhang, NM Rahman, WC Wang, NV Kidambi, C Tokunaga, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2024 | | 2024 |
| Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS WC Wang, S Zhang, S Sharma, M Lee, S Mukhopadhyay 2024 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2024 | | 2024 |
| Cognitive Sensing for Energy-Efficient Edge Intelligence M Lee, S Sharma, WC Wang, H Kumawat, NM Rahman, S Mukhopadhyay 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2024 | | 2024 |
E Ray HSIEHDept. of Electrical Engineering, National Central University在 ncu.edu.tw 的电子邮件经过验证
E Ray HSIEHDept. of Electrical Engineering, National Central University在 ncu.edu.tw 的电子邮件经过验证
Steve ChungNational Yang Ming Chiao Tung University在 nycu.edu.tw 的电子邮件经过验证