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Namo Vijayakumar
Namo Vijayakumar
Auburn University
在 auburn.edu 的电子邮件经过验证
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The effect of iso-thermal aging on vibrational performance of SAC 105 and 305 alloys
N Vijayakumar, S Thirugnanasambandam, P Soobramaney, J Zhang, ...
2013 IEEE International Symposium on Advanced Packaging Materials, 69-81, 2013
142013
Drop Reliability test on different dimensional Lead-free Wafer level Chip Scale packages
S Thirugnanasambandam, N Vijayakumar, J Zhang, J Evans, F Xie, ...
SMTA International, 2012
92012
The Effects of Thermal Aging on the Mechanical Behavior of Fine Pitch Electronics Packages
NP Vijayakumar
Auburn University, 2013
42013
Impact of Component Termination on Conductive Adhesive Reliability for Harsh Environment Electronics
JL Evans, F Xie, H Pai, N Vijayakumar, J Cobb, D Skamser, A Hill, S Harry
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