| Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class S Cheon, H Lee, CO Kim, SH Lee IEEE Transactions on Semiconductor Manufacturing 32 (2), 163-170, 2019 | 245 | 2019 |
| Digital Twinning and Optimization of Manufacturing Process Flows H Lee, H Yang Journal of Manufacturing Science and Engineering 145 (11), 111008, 2023 | 5 | 2023 |
| Privacy-preserving Neural Networks for Smart Manufacturing H Lee, D Finke, H Yang Journal of Computing and Information Science in Engineering 24 (7), 071002, 2024 | 2 | 2024 |
| Digital Twin Simulation and Optimization of Manufacturing Process Flows H Lee, H Yang International Manufacturing Science and Engineering Conference 87240 …, 2023 | 2 | 2023 |
| Random Forest Method and Simulation-based Effect Analysis for Real-time Target Re-designation in Missile Flight H Lee, JY Jang, JM Ahn, CO Kim Journal of the Korea Society for Simulation 27 (2), 35-48, 2018 | 1 | 2018 |
| 랜덤 포레스트 기법과 시뮬레이션을 이용한 전술 탄도미사일 위협 상황에서의 유연한 교전 체인 모델 연구 장재연， 이한강， 김창욱， 정경학 대한산업공학회 춘계공동학술대회 논문집, 1715-1730, 2018 | | 2018 |
| 반도체 에칭 공정에서 웨이퍼 내의 공간 위치를 고려한 가상 계측 모형 이한강， 김창욱， 장재연， 엄민용， 태재웅 대한산업공학회 춘계공동학술대회 논문집, 4339-4362, 2017 | | 2017 |
Daniel FinkePenn State在 psu.edu 的电子邮件经过验证
Daniel FinkePenn State在 psu.edu 的电子邮件经过验证
Jaeyeon JangAssistant Professor, The Catholic University of Korea在 catholic.ac.kr 的电子邮件经过验证