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Ramya Cuduvally
Ramya Cuduvally
Postdoctoral fellow, McMaster University
在 mcmaster.ca 的电子邮件经过验证
标题
引用次数
引用次数
年份
Performance enhancement of piezoelectric energy harvesters using multilayer and multistep beam configurations
R Sriramdas, S Chiplunkar, RM Cuduvally, R Pratap
IEEE Sensors Journal 15 (6), 3338-3348, 2015
692015
Toward accurate composition analysis of GaN and AlGaN using atom probe tomography
R Morris, R Cuduvally, D Melkonyan, C Fleischmann, M Zhao, L Arnoldi, ...
Journal of Vacuum Science & Technology B 36 (3), 2018
312018
Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantification
RJH Morris, R Cuduvally, D Melkonyan, M Zhao, P van der Heide, ...
Ultramicroscopy 206, 112813, 2019
182019
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs
R Cuduvally, RJH Morris, P Ferrari, J Bogdanowicz, C Fleischmann, ...
Ultramicroscopy 210, 112918, 2020
142020
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN
RJH Morris, R Cuduvally, JR Lin, M Zhao, W Vandervorst, M Thuvander, ...
Ultramicroscopy 241, 113592, 2022
92022
Tunneling-triggered bipolar action in junctionless tunnel field-effect transistor
S Gundapaneni, A Goswami, O Badami, R Cuduvally, A Konar, M Bajaj, ...
Applied Physics Express 7 (12), 124302, 2014
82014
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
R Cuduvally, RJH Morris, G Oosterbos, P Ferrari, C Fleischmann, ...
Journal of Applied Physics 132 (7), 2022
52022
Two-parameter quasi-ballistic transport model for nanoscale transistors
JU Lee, R Cuduvally, P Dhakras, P Nguyen, HL Hughes
Scientific Reports 9 (1), 525, 2019
32019
A Correlative Study of Silicon Carbide Power Devices Using Atom Probe Tomography and Transmission Electron Microscopy
R Cuduvally, B Guerguis, B Langelier, ND Bassim, R Cuduvally, ...
International Symposium for Testing and Failure Analysis 84741, 500-508, 2023
22023
Evaporation dynamics of boron dopants in silicon
JO de Beeck, C Freysoldt, R Cuduvally, J Scheerder, RJH Morris, ...
Microscopy and Microanalysis 27 (S1), 418-420, 2021
12021
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography
B Guerguis, R Cuduvally, RJH Morris, G Arcuri, B Langelier, N Bassim
Ultramicroscopy 266, 114034, 2024
2024
Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis
B Guerguis, R Cuduvally, RJH Morris, G Arcuri, B Langelier, N Bassim
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 036, 2024
2024
Opportunities and Challenges in APT Metrology for Semiconductor Applications
C Fleischmann, R Cuduvally, R Morris, D Melkonyan, JO de Beeck, ...
Microscopy and Microanalysis 25 (S2), 312-313, 2019
2019
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
R Cuduvally, G Oosterbos, R Morris, C Fleischmann, P Ferrari, ...
2019
Two-Parameter Quasi-Ballistic Transport Model for Nanoscale Transistors
R Cuduvally, P Dhakras, P Nguyen, HL Hughes, JU Lee
arXiv preprint arXiv:1803.07920, 2018
2018
Quantitative compositional analysis of compound semiconductors by atom probe tomography
R Cuduvally, R Morris, J Bogdanowicz, D Melkonyan, L Arnoldi, ...
2018
3D imaging of atom probe tip shapes with atomic force microscopy
C Fleischmann, K Paredis, D Melkonyan, J Op de Beeck, J Bogdanowicz, ...
2018
A critical view on the accuracy of dopant profiling in atom probe tomography: The case of boron in silicon
D Melkonyan, C Fleischmann, J Bogdanowicz, R Morris, R Cuduvally, ...
2018
Correcting the boron concentration for the detection losses through multi hit events.
D Melkonyan, C Fleischmann, J Bogdanowicz, R Morris, R Cuduvally, ...
2018
Influence of the tip field, laser, pole and zone lines on the quantification of GaN/AlGaN heterostructures
R Morris, R Cuduvally, D Melkonyan, M Zhao, P van der Heide, ...
2018
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