| Active microelement testing by interferometry using time-average and quasi-stroboscopic techniques LA Salbut, K Patorski, M Jozwik, JM Kacperski, C Gorecki, A Jacobelli, ... Microsystems Engineering: Metrology and Inspection III 5145, 23-32, 2003 | 74 | 2003 |
| Active, LCoS based laser interferometer for microelements studies J Kacperski, M Kujawinska Optics express 14 (21), 9664-9678, 2006 | 61 | 2006 |
| Interferometric methods for static and dynamic characterizations of micromembranes for sensing functions L Salbut, J Kacperski, AR Styk, M Jozwik, C Gorecki, H Urey, A Jacobelli, ... Optical Micro-and Nanometrology in Manufacturing Technology 5458, 16-24, 2004 | 25 | 2004 |
| Graphene as a Schottky barrier contact to AlGaN/GaN heterostructures M Dub, P Sai, A Przewłoka, A Krajewska, M Sakowicz, P Prystawko, ... Materials 13 (18), 4140, 2020 | 17 | 2020 |
| Investigation of n-type gallium nitride grating for applications in coherent thermal sources V Janonis, S Tumėnas, P Prystawko, J Kacperski, I Kašalynas Applied Physics Letters 116 (11), 2020 | 16 | 2020 |
| Organic vapor sensing mechanisms by large-area graphene back-gated field-effect transistors under UV irradiation K Drozdowska, A Rehman, P Sai, B Stonio, A Krajewska, M Dub, ... ACS sensors 7 (10), 3094-3101, 2022 | 14 | 2022 |
| Highly stable GaN-based betavoltaic structures grown on different dislocation density substrates S Grzanka, L Marona, P Wiśniewski, G Targowski, B Zaręba, K Wincel, ... Solid-State Electronics 167, 107784, 2020 | 6 | 2020 |
| Directive and coherent thermal emission of hybrid surface plasmon-phonon polaritons in n-GaN gratings of linear and radial shapes V Janonis, J Kacperski, A Selskis, RM Balagula, P Prystawko, I Kašalynas Optical Materials Express 13 (9), 2662-2673, 2023 | 5 | 2023 |
| Benchmarking instrumentation tools for the characterization of microlenses within the EC Network of Excellence on Micro-Optics (NEMO) H Ottevaere, J Schwider, J Kacperski, L Steinbock, K Weible, ... Optical Micro-and Nanometrology in Microsystems Technology II 6995, 160-168, 2008 | 5 | 2008 |
| Multifunctional interferometric platform for static and dynamic MEMS measurement J Kacperski, M Kujawinska Advanced Characterization Techniques for Optics, Semiconductors, and …, 2005 | 5 | 2005 |
| Modified linear and circular carrier-frequency Fourier-transform method applied for studies of vibrating microelements J Kacperski, M Kujawinska, J Krezel Optical Micro-and Nanometrology in Manufacturing Technology 5458, 287-298, 2004 | 5 | 2004 |
| Active microinterferometer with liquid crystal on silicon (LCOS) for extended range static and dynamic micromembrane measurement J Kacperski, M Kujawinska, X Wang, PJ Bos Interferometry XII: Applications 5532, 37-43, 2004 | 5 | 2004 |
| Phase only SLM as a reference element in Twyman-Green laser interferometer for MEMS measurement J Kacperski, M Kujawinska Optical Measurement Systems for Industrial Inspection V 6616, 989-999, 2007 | 3 | 2007 |
| Grating-Gate AlGaN/GaN Plasmonic Crystals for Terahertz Waves Manipulation M Dub, P Sai, A Krajewska, DB But, Y Ivonyak, P Prystawko, J Kacperski, ... International Journal of High Speed Electronics and Systems, 2440020, 2024 | 2 | 2024 |
| Wielofunkcyjna platforma interferencyjna do pomiarów aktywnych elementów MEMS J Kacperski The Institute of Micromechanics and Photonics, 2009 | 2 | 2009 |
| Optical characterization of spherical microlenses: a round robin experiment within the EC Network of Excellence on Micro-Optics (NEMO) H Ottevaere, J Schwider, J Lamprecht, J Kacperski, A Szpak, L Steinbock, ... Optical Micro-and Nanometrology in Microsystems Technology 6188, 313-321, 2006 | 2 | 2006 |
| Pros and Cons of (NH4)2S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode I Levchenko, S Kryvyi, E Kamińska, J Smalc-Koziorowska, S Grzanka, ... Materials 17 (18), 4520, 2024 | 1 | 2024 |
| Control of the unscreened modes in AlGaN/GaN terahertz plasmonic crystals M Dub, P Sai, Y Ivonyak, DB But, J Kacperski, P Prystawko, R Kucharski, ... Journal of Applied Physics 135 (19), 2024 | 1 | 2024 |
| Investigation of the reflectivity spectra of n-type GaN semiconductor with surface relief grating V Janonis, P Prystawko, K Gibasiewicz, J Kacperski, I Kašalynas 2019 44th International Conference on Infrared, Millimeter, and Terahertz …, 2019 | 1 | 2019 |
| Dynamic measurements of actuators driven by AlN layers J Kacperski, M Kujawinska, SC Leon, L Nieradko, M Jozwik, C Gorecki Lasers and Applications 5958, 139-146, 2005 | 1 | 2005 |
