| Surface Analysis-The Principal Techniques JLS Lee, IS Gilmore John Wiley & Sons, 2009 | 1538* | 2009 |
| Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard Analytical chemistry 82 (1), 98-105, 2010 | 184 | 2010 |
| Quantification and methodology issues in multivariate analysis of ToF‐SIMS data for mixed organic systems JLS Lee, IS Gilmore, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2008 | 104 | 2008 |
| Multivariate image analysis strategies for ToF‐SIMS images with topography JLS Lee, IS Gilmore, IW Fletcher, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2009 | 92 | 2009 |
| Topography and field effects in secondary ion mass spectrometry–Part I: Conducting samples JLS Lee, IS Gilmore, MP Seah, IW Fletcher Journal of The American Society for Mass Spectrometry 22 (10), 2011 | 51 | 2011 |
| Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS JLS Lee, IS Gilmore, IW Fletcher, MP Seah Applied Surface Science 255 (4), 1560-1563, 2008 | 50 | 2008 |
| Sputtering Yields of Gold Nanoparticles by C60 Ions L Yang, MP Seah, EH Anstis, IS Gilmore, JLS Lee The Journal of Physical Chemistry C 116 (16), 9311-9318, 2012 | 46 | 2012 |
| Topography and field effects in secondary ion mass spectrometry Part II: insulating samples JLS Lee, IS Gilmore, MP Seah, AP Levick, AG Shard Surface and interface analysis 44 (2), 238-245, 2012 | 36 | 2012 |
| Improving Secondary Ion Mass Spectrometry C60n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing R Havelund, A Licciardello, J Bailey, N Tuccitto, D Sapuppo, IS Gilmore, ... Analytical chemistry 85 (10), 5064-5070, 2013 | 26 | 2013 |
| VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report AG Shard, R Foster, IS Gilmore, JLS Lee, S Ray, L Yang Surface and interface analysis 43 (1‐2), 510-513, 2011 | 26 | 2011 |
| Organic depth profiling of a binary system: the compositional effect on secondary ion yield and a model for charge transfer during secondary ion emission AG Shard, A Rafati, R Ogaki, JLS Lee, S Hutton, G Mishra, MC Davies, ... The Journal of Physical Chemistry B 113 (34), 11574-11582, 2009 | 25 | 2009 |
| Linearity of the instrumental intensity scale in TOF‐SIMS—a VAMAS interlaboratory study JLS Lee, IS Gilmore, MP Seah Surface and interface analysis 44 (1), 1-14, 2012 | 24 | 2012 |
| The application of multivariate data analysis techniques in surface analysis JLS Lee, IS Gilmore Surface analysis–the principal techniques, 563-612, 2009 | 24 | 2009 |
| Surface mass spectrometry of two component drug–polymer systems: novel chromatographic separation method using gentle-secondary ion mass spectrometry (G-SIMS) R Ogaki, IS Gilmore, MR Alexander, FM Green, MC Davies, JLS Lee Analytical chemistry 83 (10), 3627-3631, 2011 | 23 | 2011 |
| Static SIMS–VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification FM Green, IS Gilmore, JLS Lee, SJ Spencer, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2010 | 21 | 2010 |
| The development of standards and guides for multivariate analysis in surface chemical analysis JLS Lee, BJ Tyler, MS Wagner, IS Gilmore, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2009 | 21 | 2009 |
| Artifacts in the sputtering of inorganics by C60n+ JLS Lee, MP Seah, IS Gilmore Applied Surface Science 255 (4), 934-937, 2008 | 13 | 2008 |
| Predicting the wettability of patterned ITO surface using ToF‐SIMS images L Yang, AG Shard, JLS Lee, S Ray Surface and Interface Analysis 42 (6‐7), 911-915, 2010 | 9 | 2010 |
| Proposed terminology for multivariate analysis in surface chemical analysis–vocabulary–part 1: general terms and terms for the spectroscopies JLS Lee, IS Gilmore, MP Seah Chem. Anal., 1-10, 2008 | 3 | 2008 |
| Time-of-flight secondary ion mass spectrometry-fundamental issues for quantitative measurements and multivariate data analysis J Lee University of Oxford, 2011 | 2 | 2011 |
