关注
Emiliano Bonera
Emiliano Bonera
在 unimib.it 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Atomic-layer deposition of Lu2O3
G Scarel, E Bonera, C Wiemer, G Tallarida, S Spiga, M Fanciulli, ...
Applied Physics Letters 85 (4), 630-632, 2004
1332004
Raman spectroscopy determination of composition and strain in Si1-xGex/Si heterostructures
F Pezzoli, E Bonera, E Grilli, M Guzzi, S Sanguinetti, D Chrastina, G Isella, ...
Materials science in semiconductor processing 11 (5-6), 279-284, 2008
1092008
Combining high resolution and tensorial analysis in Raman stress measurements of silicon
E Bonera, M Fanciulli, DN Batchelder
Journal of applied physics 94 (4), 2729-2740, 2003
992003
Phonon strain shift coefficients in Si1− xGex alloys
F Pezzoli, E Bonera, E Grilli, M Guzzi, S Sanguinetti, D Chrastina, G Isella, ...
Journal of Applied Physics 103 (9), 2008
912008
Energy-band diagram of metal/Lu2O3/silicon structures
G Seguini, E Bonera, S Spiga, G Scarel, M Fanciulli
Applied physics letters 85 (22), 5316-5318, 2004
712004
Dielectric Properties of High- Oxides: Theory and Experiment for
E Bonera, G Scarel, M Fanciulli, P Delugas, V Fiorentini
Physical review letters 94 (2), 027602, 2005
692005
High-yield fabrication of entangled photon emitters for hybrid quantum networking using high-temperature droplet epitaxy
F Basso Basset, S Bietti, M Reindl, L Esposito, A Fedorov, D Huber, ...
Nano letters 18 (1), 505-512, 2018
642018
Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures.
F Isa, M Salvalaglio, YA Dasilva, M Meduňa, M Barget, A Jung, T Kreiliger, ...
Advanced materials (Deerfield Beach, Fla.) 28 (5), 884-888, 2015
482015
Raman spectroscopy for a micrometric and tensorial analysis of stress in silicon
E Bonera, M Fanciulli, DN Batchelder
Applied Physics Letters 81 (18), 3377-3379, 2002
462002
Raman spectroscopy of strain in subwavelength microelectronic devices
E Bonera, M Fanciulli, M Mariani
Applied Physics Letters 87 (11), 2005
342005
Crystal defects and junction properties in the evolution of device fabrication technology
I Mica, ML Polignano, G Carnevale, P Ghezzi, M Brambilla, F Cazzaniga, ...
Journal of Physics: Condensed Matter 14 (48), 13403, 2002
342002
Development of a combined confocal and scanning near‐field Raman microscope for deep UV laser excitation
HS Sands, F Demangeot, E Bonera, S Webster, R Bennett, IP Hayward, ...
Journal of Raman Spectroscopy 33 (9), 730-739, 2002
342002
Stability and universal encapsulation of epitaxial Xenes
A Molle, G Faraone, A Lamperti, D Chiappe, E Cinquanta, C Martella, ...
Faraday Discussions 227, 171-183, 2021
332021
Raman stress maps from finite-element models of silicon structures
E Bonera, M Fanciulli, G Carnevale
Journal of applied physics 100 (3), 2006
332006
Band alignment at the La2Hf2O7∕(001) Si interface
G Seguini, S Spiga, E Bonera, M Fanciulli, A Reyes Huamantinco, ...
Applied physics letters 88 (20), 2006
332006
High–temperature droplet epitaxy of symmetric GaAs/AlGaAs quantum dots
S Bietti, FB Basset, A Tuktamyshev, E Bonera, A Fedorov, S Sanguinetti
Scientific Reports 10 (1), 6532, 2020
322020
Raman efficiency in SiGe alloys
A Picco, E Bonera, E Grilli, M Guzzi, M Giarola, G Mariotto, D Chrastina, ...
Physical Review B—Condensed Matter and Materials Physics 82 (11), 115317, 2010
322010
Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations
E Bonera, F Pezzoli, A Picco, G Vastola, M Stoffel, E Grilli, M Guzzi, ...
Physical Review B—Condensed Matter and Materials Physics 79 (7), 075321, 2009
322009
Disassembling silicene from native substrate and transferring onto an arbitrary target substrate
C Martella, G Faraone, MH Alam, D Taneja, L Tao, G Scavia, E Bonera, ...
Advanced Functional Materials 30 (42), 2004546, 2020
312020
A novel 0.16 μm—300 V SOIBCD for ultrasound medical applications
M Sambi, D Merlini, P Galbiati, E Bonera, F Belletti
2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011
312011
系统目前无法执行此操作,请稍后再试。
文章 1–20