| Reliability study of power RF LDMOS device under thermal stress MA Belaïd, K Ketata, K Mourgues, M Gares, M Masmoudi, J Marcon Microelectronics journal 38 (2), 164-170, 2007 | 40 | 2007 |
| Analysis and simulation of self-heating effects on RF LDMOS devices MA Belaïd, K Ketata, H Maanane, M Gares, K Mourgues, J Marcon 2005 International Conference On Simulation of Semiconductor Processes and …, 2005 | 39 | 2005 |
| Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors MA Belaïd, K Daoud Microelectronics Reliability 50 (9-11), 1763-1767, 2010 | 22 | 2010 |
| Study of RF N− LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF H Maanane, M Masmoudi, J Marcon, MA Belaid, K Mourgues, C Tolant, ... Microelectronics Reliability 46 (5-6), 994-1000, 2006 | 21 | 2006 |
| Comparative analysis of accelerated ageing effects on power RF LDMOS reliability MA Belaïd, K Ketata, K Mourgues, H Maanane, M Masmoudi, J Marcon Microelectronics Reliability 45 (9-11), 1732-1737, 2005 | 21 | 2005 |
| Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests M Tlig, JBH Slama, MA Belaid Microelectronics Reliability 53 (9-11), 1793-1797, 2013 | 20 | 2013 |
| Reliability study of Power RF LDMOS for Radar Application. H Maanane, P Bertram, J Marcon, M Masmoudi, MA Belaïd, K Mourgues, ... Microelectron. Reliab. 44 (9-11), 1449-1454, 2004 | 12 | 2004 |
| Hot carrier reliability of RF N-LDMOS for S band radar application M Gares, H Maanane, M Masmoudi, P Bertram, J Marcon, MA Belaid, ... Microelectronics Reliability 46 (9-11), 1806-1811, 2006 | 11 | 2006 |
| Power RF N-LDMOS ageing effect on conducted electromagnetic interferences M Tlig, JBH Slama, MA Belaid 10th International Multi-Conferences on Systems, Signals & Devices 2013 …, 2013 | 10 | 2013 |
| Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests M Tlig, JBH Slama, MA Belaid 2014 International Conference on Electrical Sciences and Technologies in …, 2014 | 8 | 2014 |
| 2-D simulation and analysis of temperature effects on electrical parameters degradation of power RF LDMOS device MA Belaïd, K Ketata, M Gares, J Marcon, K Mourgues, M Masmoudi Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 8 | 2006 |
| Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests MA Belaïd, K Ketata, M Masmoudi, M Gares, H Maanane, J Marcon Microelectronics Reliability 46 (9-11), 1800-1805, 2006 | 8 | 2006 |
| Characterization and modelling of power RF LDMOS transistor including self-heating effects MA Belaïd, H Maanane, K Mourgues, M Masmoudi, K Ketata, J Marcon Proceedings. The 16th International Conference on Microelectronics, 2004 …, 2004 | 8 | 2004 |
| Performance drifts of N-MOSFETs under pulsed RF life test MA Belaïd, M Gares, K Daoud, O Latry Microelectronics Reliability 54 (9-10), 1851-1855, 2014 | 7 | 2014 |
| RF performance reliability of power N‐LDMOS under pulsed‐RF aging life test in radar application S‐band M Ali Belaïd, A Almusallam, M Masmoudi IET Circuits, Devices & Systems 14 (6), 805-810, 2020 | 6 | 2020 |
| Symptom reliability: S‐parameters evaluation of power laterally diffused‐metal–oxide–semiconductor field‐effect transistor after pulsed‐RF life tests for a radar application MA Belaïd IET Circuits, Devices & Systems 12 (5), 571-578, 2018 | 6 | 2018 |
| Tri-layer linearly-polarized discrete lens antenna operating in X-band, design & characterization H Kaouach, MA Belaid AEU-International Journal of Electronics and Communications 86, 117-124, 2018 | 6 | 2018 |
| Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests MA Belaïd, AM Nahhas, M Gares, K Daoud, O Latry Microelectronics Journal 45 (12), 1800-1805, 2014 | 6 | 2014 |
| Study of hot-carrier effects on power RF LDMOS device reliability M Gares, MA Belaïd, H Maanane, M Masmoudi, J Marcon, K Mourgues, ... Microelectronics Reliability 47 (9-11), 1394-1399, 2007 | 6 | 2007 |
| Hot-carrier effects on power RF LDMOS device reliability MA Belaid, K Ketata 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems …, 2008 | 5 | 2008 |
