Dynamic-ofa: Runtime dnn architecture switching for performance scaling on heterogeneous embedded platforms W Lou, L Xun, A Sabet, J Bi, J Hare, GV Merrett Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 38 | 2021 |
Soft error reliability improvement of digital circuits by exploiting a fast gate sizing scheme M Raji, MA Sabet, B Ghavami IEEE Access 7, 66485-66495, 2019 | 18 | 2019 |
A scalable solution to soft error tolerant circuit design using partitioning-based gate sizing MA Sabet, B Ghavami, M Raji IEEE Transactions on Reliability 66 (1), 245-256, 2017 | 15 | 2017 |
Dynamic transformer for efficient machine translation on embedded devices H Parry, L Xun, A Sabet, J Bi, J Hare, GV Merrett 2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD), 1-6, 2021 | 10 | 2021 |
Temporal early exits for efficient video object detection A Sabet, J Hare, B Al-Hashimi, GV Merrett arXiv preprint arXiv:2106.11208, 2021 | 10 | 2021 |
Solar irradiance anticipative transformer TM Mercier, T Rahman, A Sabet Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2023 | 9 | 2023 |
GPU-accelerated soft error rate analysis of large-scale integrated circuits MA Sabet, B Ghavami, M Raji IEEE Design & Test 35 (6), 78-85, 2018 | 5 | 2018 |
Similarity-aware CNN for efficient video recognition at the edge A Sabet, J Hare, BM Al-Hashimi, GV Merrett IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 2 | 2021 |
Vision transformer models to measure solar irradiance using sky images in temperate climates TM Mercier, A Sabet, T Rahman Applied Energy 362, 122967, 2024 | 1 | 2024 |
Statistical soft error rate estimation of combinational circuits using Bayesian networks MA Sabet, B Ghavami COMPEL-The international journal for computation and mathematics in …, 2016 | 1 | 2016 |
Data for Similarity-aware CNN for Efficient Video Recognition at the Edge M Sabetsarvestani, J Hare, B Al-Hashimi, G Merrett University of Southampton, 2021 | | 2021 |
Multiple-Event Soft Error Reduction of Combinational Circuits Using Gate Sizing Based on Sensitivity Parameter MA Sabet, B Ghavami, M Raji TABRIZ JOURNAL OF ELECTRICAL ENGINEERING (TJEE) 47 (2), 445-454, 2017 | | 2017 |
Multiple Soft Error Reduction of Combinational Circuits Based on Sensitivity Parameter mohsen raji M.Amin Sabet,behnam ghavami The 24th Iranian Conference on Electrical Engineering (ICEE 2016), 2016 | | 2016 |
A Sensitivity-based approach to increase the digital circuits reliability against multiple transient faults using gate sizing MR M.Amin Sabet, Behnam Ghavami 21st Computer Society of Iran Computer Conference (CSICC), At Tehran, Iran, 2016 | | 2016 |