| The Electrode‐Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO‐Based Ferroelectric Capacitors R Alcala, M Materano, PD Lomenzo, P Vishnumurthy, W Hamouda, ... Advanced Functional Materials 33 (43), 2303261, 2023 | 24 | 2023 |
| Reliability Improvement from La2O3 Interfaces in Hf0.5Zr0.5O2‐Based Ferroelectric Capacitors F Mehmood, R Alcala, P Vishnumurthy, B Xu, R Sachdeva, T Mikolajick, ... Advanced Materials Interfaces 10 (8), 2202151, 2023 | 14 | 2023 |
| The Role of Interface Dynamics on the Reliability Performance of BEOL Integrated Ferroelectric HfO2 Capacitors R Alcala, PD Lomenzo, T Mittmann, B Xu, R Guido, S Lancaster, ... 2022 International Electron Devices Meeting (IEDM), 32.8. 1-32.8. 4, 2022 | 4 | 2022 |
| Influence of Interfacial Oxide Layers in Hf0.5Zr0.5O2 based ferroelectric capacitors on reliability performance R Alcala, F Mehmood, P Vishnumurthy, T Mittmann, T Mikolajick, ... 2022 IEEE International Memory Workshop (IMW), 1-4, 2022 | 2 | 2022 |
| Influence of Biaxial Strain and Interfacial Layer Growth on Ferroelectric Wake-Up and Phase Transition Fields in ZrO2 B Xu, R Ganser, KM Holsgrove, X Wang, P Vishnumurthy, T Mikolajick, ... ACS Applied Materials & Interfaces, 2024 | 1 | 2024 |
| Ferroelectric HfO2-based Capacitors for FeRAM: Reliability from Field Cycling Endurance to Retention P Vishnumurthy, R Alcala, T Mikolajick, U Schroeder, LA Antunes, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 1-10, 2024 | 1 | 2024 |
| Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors P Vishnumurthy, B Xu, F Wunderwald, C Richter, O Rehm, L Baumgarten, ... ACS Applied Electronic Materials, 2024 | | 2024 |
Thomas MikolajickScientific Director, NaMLab GmbH and Professor for Nanoelectronics, TU Dresden在 namlab.com 的电子邮件经过验证
