| Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications JA Woollam, BD Johs, CM Herzinger, JN Hilfiker, RA Synowicki, ... Optical Metrology: A Critical Review 10294, 3-28, 1999 | 450 | 1999 |
| Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry JN Hilfiker, N Singh, T Tiwald, D Convey, SM Smith, JH Baker, ... Thin Solid Films 516 (22), 7979-7989, 2008 | 360 | 2008 |
| Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications B Johs, JA Woollam, CM Herzinger, JN Hilfiker, RA Synowicki, CL Bungay Optical metrology: a critical review 10294, 58-87, 1999 | 270 | 1999 |
| Spectroscopic ellipsometry: practical application to thin film characterization HG Tompkins, JN Hilfiker Momentum Press, 2015 | 262 | 2015 |
| Optical properties of bulk and thin-film on Si and Pt S Zollner, AA Demkov, R Liu, PL Fejes, RB Gregory, P Alluri, JA Curless, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 154 | 2000 |
| Deposition factors and band gap of zinc-blende AlN MP Thompson, GW Auner, TS Zheleva, KA Jones, SJ Simko, JN Hilfiker Journal of Applied Physics 89 (6), 3331-3336, 2001 | 146 | 2001 |
| Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si S Zollner, JG Chen, E Duda, T Wetteroth, SR Wilson, JN Hilfiker Journal of applied physics 85 (12), 8353-8361, 1999 | 111 | 1999 |
| Natural optical activity as the origin of the large chiroptical properties in π-conjugated polymer thin films J Wade, JN Hilfiker, JR Brandt, L Liirò-Peluso, L Wan, X Shi, F Salerno, ... Nature communications 11 (1), 6137, 2020 | 90 | 2020 |
| Coplanar transmission lines on thin substrates for high-speed low-loss propagation MY Frankel, RH Voelker, JN Hilfiker IEEE transactions on microwave theory and techniques 42 (3), 396-402, 1994 | 76 | 1994 |
| Fundamental studies on large area Cu (In, Ga) Se2 films for high efficiency solar cells AM Hermann, C Gonzalez, PA Ramakrishnan, D Balzar, N Popa, P Rice, ... Solar Energy Materials and Solar Cells 70 (3), 345-361, 2001 | 72 | 2001 |
| Process study for laser-induced surface coloration HY Zheng, GC Lim, XC Wang, JL Tan, J Hilfiker Journal of Laser Applications 14 (4), 215-220, 2002 | 53 | 2002 |
| Optical and magneto-optical constants of s KW Wierman, JN Hilfiker, RF Sabiryanov, SS Jaswal, RD Kirby, ... Physical Review B 55 (5), 3093, 1997 | 52 | 1997 |
| Dielectric function modeling JN Hilfiker, T Tiwald Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental …, 2018 | 49 | 2018 |
| Optical anisotropy and charge-transfer transition energies in BiFeO from 1.0 to 5.5 eV SG Choi, HT Yi, SW Cheong, JN Hilfiker, R France, AG Norman Physical Review B—Condensed Matter and Materials Physics 83 (10), 100101, 2011 | 46 | 2011 |
| Calibration of a multi-pass photoacoustic spectrometer cell using light-absorbing aerosols N Bluvshtein, JM Flores, Q He, E Segre, L Segev, N Hong, A Donohue, ... Atmospheric Measurement Techniques 10 (3), 1203-1213, 2017 | 45 | 2017 |
| Microstructural and infrared optical properties of electrochemically etched highly doped 4H–SiC S Zangooie, POA Persson, JN Hilfiker, L Hultman, H Arwin Journal of Applied Physics 87 (12), 8497-8503, 2000 | 43 | 2000 |
| Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry JN Hilfiker, M Stadermann, J Sun, T Tiwald, JS Hale, PE Miller, ... Applied Surface Science 421, 508-512, 2017 | 42 | 2017 |
| Ellipsometry, variable angle spectroscopic JA Woollam, JN Hilfiker, RA Synowicki Wiley Encyclopedia of Electrical and Electronics Engineering, 1-10, 1999 | 41 | 1999 |
| Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling SH Hsu, ES Liu, YC Chang, JN Hilfiker, YD Kim, TJ Kim, CJ Lin, GR Lin physica status solidi (a) 205 (4), 876-879, 2008 | 40 | 2008 |
| Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells MF Saenger, J Sun, M Schädel, J Hilfiker, M Schubert, JA Woollam Thin Solid Films 518 (7), 1830-1834, 2010 | 37 | 2010 |
