| Characteristic impedance determination using propagation constant measurement RB Marks, DF Williams IEEE Microwave and guided wave Letters 1 (6), 141-143, 1991 | 472 | 1991 |
| A general waveguide circuit theory RB Marks, DF Williams Journal of research of the National Institute of Standards and Technology 97 …, 1992 | 445 | 1992 |
| Comparison of on-wafer calibrations DF Williams, RB Marks, A Davidson 38th ARFTG Conference Digest 20, 68-81, 1991 | 276 | 1991 |
| Transmission line capacitance measurement DF Williams, RB Marks IEEE Microwave and guided wave letters 1 (9), 243-245, 1991 | 273 | 1991 |
| Design and performance of coplanar waveguide bandpass filters DF Williams, SE Schwarz IEEE transactions on microwave theory and techniques 31 (7), 558-566, 1983 | 192 | 1983 |
| Accurate transmission line characterization DF Williams, RB Marks IEEE Microwave and Guided Wave Letters 3 (8), 247-249, 1993 | 164 | 1993 |
| An optimal vector-network-analyzer calibration algorithm DF Williams, JCM Wang, U Arz IEEE Transactions on Microwave Theory and Techniques 51 (12), 2391-2401, 2003 | 161 | 2003 |
| A statistical study of de-embedding applied to eye diagram analysis PD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ... IEEE Transactions on Instrumentation and Measurement 61 (2), 475-488, 2011 | 148 | 2011 |
| Calibrated measurement of optoelectronic frequency response PD Hale, DF Williams IEEE transactions on microwave theory and techniques 51 (4), 1422-1429, 2003 | 118 | 2003 |
| Calibration of sampling oscilloscopes with high-speed photodiodes TS Clement, PD Hale, DF Williams, CM Wang, A Dienstfrey, DA Keenan IEEE Transactions on microwave theory and techniques 54 (8), 3173-3181, 2006 | 117 | 2006 |
| An optimal multiline TRL calibration algorithm DF Williams, CM Wang, U Arz IEEE MTT-S International Microwave Symposium Digest, 2003 3, 1819-1822, 2003 | 112 | 2003 |
| Compensation of random and systematic timing errors in sampling oscilloscopes PD Hale, CM Wang, DF Williams, KA Remley, JD Wepman IEEE Transactions on Instrumentation and Measurement 55 (6), 2146-2154, 2006 | 110 | 2006 |
| Permittivity characterization of low-k thin films from transmission-line measurements MD Janezic, DF Williams, V Blaschke, A Karamcheti, CS Chang IEEE Transactions on Microwave Theory and Techniques 51 (1), 132-136, 2003 | 106 | 2003 |
| Covariance-based vector-network-analyzer uncertainty analysis for time-and frequency-domain measurements A Lewandowski, DF Williams, PD Hale, JCM Wang, A Dienstfrey IEEE Transactions on Microwave Theory and Techniques 58 (7), 1877-1886, 2010 | 100 | 2010 |
| Linearization of large-signal scattering functions J Verspecht, DF Williams, D Schreurs, KA Remley, MD McKinley IEEE Transactions on microwave theory and techniques 53 (4), 1369-1376, 2005 | 100 | 2005 |
| Covariance-based uncertainty analysis of the NIST electrooptic sampling system DF Williams, A Lewandowski, TS Clement, JCM Wang, PD Hale, ... IEEE Transactions on Microwave Theory and Techniques 54 (1), 481-491, 2006 | 92 | 2006 |
| 500 GHz–750 GHz rectangular-waveguide vector-network-analyzer calibrations DF Williams IEEE Transactions on Terahertz Science and Technology 1 (2), 364-377, 2011 | 91 | 2011 |
| Accurate characteristic impedance measurement on silicon DF Williams, U Arz, H Grabinski 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 98CH36192 …, 1998 | 89 | 1998 |
| LRM probe-tip calibrations using nonideal standards DF Williams, RB Marks IEEE transactions on microwave theory and techniques 43 (2), 466-469, 1995 | 85 | 1995 |
| Configuring and verifying reverberation chambers for testing cellular wireless devices KA Remley, J Dortmans, C Weldon, RD Horansky, TB Meurs, CM Wang, ... IEEE Transactions on Electromagnetic Compatibility 58 (3), 661-672, 2016 | 78 | 2016 |
