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Tomoyuki Shoji
Tomoyuki Shoji
在 mosk.tytlabs.co.jp 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Low-temperature phase MnBi compound: A potential candidate for rare-earth free permanent magnets
V Ly, X Wu, L Smillie, T Shoji, A Kato, A Manabe, K Suzuki
Journal of Alloys and Compounds 615, S285-S290, 2014
782014
Analysis of neutron-induced single-event burnout in SiC power MOSFETs
T Shoji, S Nishida, K Hamada, H Tadano
Microelectronics Reliability 55 (9-10), 1517-1521, 2015
612015
Nano-crystallization of amorphous alloys by ultra-rapid annealing: An effective approach to magnetic softening
K Suzuki, R Parsons, B Zang, K Onodera, H Kishimoto, T Shoji, A Kato
Journal of Alloys and Compounds 735, 613-618, 2018
552018
Nanocrystalline soft magnetic materials from binary alloy precursors with high saturation magnetization
K Suzuki, R Parsons, B Zang, K Onodera, H Kishimoto, T Shoji, A Kato
AIP Advances 9 (3), 2019
502019
Experimental and simulation studies of neutron-induced single-event burnout in SiC power diodes
T Shoji, S Nishida, K Hamada, H Tadano
Japanese Journal of Applied Physics 53 (4S), 04EP03, 2014
442014
Investigations on current filamentation of IGBTs under undamped inductive switching conditions
T Shoji, M Ishiko, T Fukami, T Ueta, K Hamada
Proceedings. ISPSD'05. The 17th International Symposium on Power …, 2005
442005
Core loss of ultra-rapidly annealed Fe-rich nanocrystalline soft magnetic alloys
R Parsons, B Zang, K Onodera, H Kishimoto, T Shoji, A Kato, K Suzuki
Journal of Magnetism and Magnetic Materials 476, 142-148, 2019
392019
Cosmic ray ruggedness of IGBTs for hybrid vehicles
S Nishida, T Shoji, T Ohnishi, T Fujikawa, N Nose, M Ishiko, K Hamada
2010 22nd International Symposium on Power Semiconductor Devices & IC's …, 2010
332010
Dramatic grain refinement and magnetic softening induced by Ni addition in FeB based nanocrystalline soft magnetic alloys
Z Li, R Parsons, B Zang, H Kishimoto, T Shoji, A Kato, J Karel, K Suzuki
Scripta Materialia 181, 82-85, 2020
322020
Neutron induced single-event burnout of IGBT
T Shoji, S Nishida, T Ohnishi, T Fujikawa, N Nose, M Ishiko, K Hamada
The 2010 International Power Electronics Conference-ECCE ASIA-, 142-148, 2010
322010
Theoretical analysis of short-circuit capability of SiC power MOSFETs
T Shoji, A Soeno, H Toguchi, S Aoi, Y Watanabe, H Tadano
Japanese Journal of Applied Physics 54 (4S), 04DP03, 2015
292015
Nano-crystallisation and magnetic softening in Fe–B binary alloys induced by ultra-rapid heating
R Parsons, B Zang, K Onodera, H Kishimoto, T Shoji, A Kato, K Suzuki
Journal of Physics D: Applied Physics 51 (41), 415001, 2018
272018
Prediction of density in amorphous and nanocrystalline soft magnetic alloys: A data mining approach
R Parsons, K Ono, Z Li, H Kishimoto, T Shoji, A Kato, MR Hill, K Suzuki
Journal of Alloys and Compounds 859, 157845, 2021
262021
Observation and analysis of neutron-induced single-event burnout in silicon power diodes
T Shoji, S Nishida, K Hamada, H Tadano
IEEE transactions on power electronics 30 (5), 2474-2480, 2014
222014
Triggering mechanism for neutron induced single-event burnout in power devices
T Shoji, S Nishida, K Hamada
Japanese Journal of Applied Physics 52 (4S), 04CP06, 2013
212013
Spin reorientation transition and hard magnetic properties of MnBi intermetallic compound
K Suzuki, X Wu, V Ly, T Shoji, A Kato, A Manabe
Journal of Applied Physics 111 (7), 2012
182012
Arrhythmogenic right ventricular dysplasia with massive involvement of the left ventricle.
T Shoji, M Kaneko, K Onodera, A Konnno, T Hasegawa, T Ikeda, ...
The Canadian Journal of Cardiology 7 (7), 303-307, 1991
181991
Dependence of short-circuit withstand capability of SiC MOSFETs on short-circuit failure time
T Shoji, M Kuwahara, M Usui
IEEE Transactions on Power Electronics 36 (10), 11739-11747, 2021
172021
Reliability design for neutron induced single-event burnout of IGBT
T Shoji, S Nishida, T Ohnishi, T Fujikawa, N Nose, K Hamada, M Ishiko
IEEJ Transactions on Industry Applications 131 (8), 992-999, 2011
172011
Nanocrystalline (Fe, Co, Ni) 86B14 soft magnetic alloys prepared by ultra-rapid annealing
Z Li, R Parsons, H Kishimoto, T Shoji, A Kato, J Karel, K Suzuki
Journal of Alloys and Compounds 902, 162544, 2022
162022
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