关注
Basker
Basker
Research Scholar, QUT, Brisbane, Australia.
在 hdr.qut.edu.au 的电子邮件经过验证
标题
引用次数
引用次数
年份
Survey of low power testing of VLSI circuits
P Basker, A Arulmurugan
2012 International Conference on Computer Communication and Informatics, 1-7, 2012
262012
Evaluation of fault coverage as the metric for different faults in VLSI circuits using 2D-LFSR
P Basker, VA Kumar
Journal of NanoScience and NanoTechnology 2 (1), 219-223, 2014
2014
系统目前无法执行此操作,请稍后再试。
文章 1–2