| Formation of very large ‘blocky alpha’grains in Zircaloy-4 VS Tong, TB Britton Acta Materialia 129, 510-520, 2017 | 54 | 2017 |
| The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements V Tong, J Jiang, AJ Wilkinson, TB Britton Ultramicroscopy 155, 62-73, 2015 | 43 | 2015 |
| The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 R Birch, S Wang, VS Tong, TB Britton Journal of Nuclear Materials 513, 221-225, 2019 | 38 | 2019 |
| Improving EBSD precision by orientation refinement with full pattern matching A Winkelmann, BM Jablon, VS Tong, C Trager‐Cowan, KP Mingard Journal of Microscopy 277 (2), 79-92, 2020 | 33 | 2020 |
| Using transmission Kikuchi diffraction to characterise α variants in an α+ β titanium alloy V Tong, S Joseph, AK Ackerman, D Dye, TB Britton Journal of microscopy 267 (3), 318-329, 2017 | 33 | 2017 |
| AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach TB Britton, VS Tong, J Hickey, A Foden, AJ Wilkinson Journal of Applied Crystallography 51 (6), 1525-1534, 2018 | 31 | 2018 |
| Picosecond dynamics of a shock-driven displacive phase transformation in Zr TD Swinburne, MG Glavicic, KM Rahman, NG Jones, J Coakley, ... Physical Review B 93 (14), 144119, 2016 | 25 | 2016 |
| Versailles project on advanced materials and standards (VAMAS) interlaboratory study on measuring the number concentration of colloidal gold nanoparticles C Minelli, M Wywijas, D Bartczak, S Cuello-Nuñez, HG Infante, J Deumer, ... Nanoscale 14 (12), 4690-4704, 2022 | 19 | 2022 |
| TrueEBSD: correcting spatial distortions in electron backscatter diffraction maps VS Tong, TB Britton Ultramicroscopy 221, 113130, 2020 | 18 | 2020 |
| In-situ study of creep in Sn-3Ag-0.5 Cu solder T Gu, VS Tong, CM Gourlay, TB Britton Acta Materialia 196, 31-43, 2020 | 17 | 2020 |
| Rapid electron backscatter diffraction mapping: Painting by numbers VS Tong, AJ Knowles, D Dye, TB Britton Materials Characterization 147, 271-279, 2019 | 17 | 2019 |
| Characterisation of slip and twinning in high rate deformed zirconium with electron backscatter diffraction V Tong, E Wielewski, B Britton arXiv preprint arXiv:1803.00236, 2018 | 16 | 2018 |
| Micropillar compression of single crystal tungsten carbide, part 2: Lattice rotation axis to identify deformation slip mechanisms V Tong, H Jones, K Mingard International Journal of Refractory Metals and Hard Materials 103, 105734, 2022 | 14 | 2022 |
| Micropillar compression of single crystal tungsten carbide, Part 1: Temperature and orientation dependence of deformation behaviour H Jones, V Tong, R Ramachandramoorthy, K Mingard, J Michler, M Gee International Journal of Refractory Metals and Hard Materials 102, 105729, 2022 | 14 | 2022 |
| Space rocks and optimising scanning electron channelling contrast TB Britton, D Goran, VS Tong Materials Characterization 142, 422-431, 2018 | 14 | 2018 |
| An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) A Koko, V Tong, AJ Wilkinson, TJ Marrow Ultramicroscopy 248, 113705, 2023 | 9 | 2023 |
| Microstructure and mechanical properties of ultrafine quaternary Al-Cu-Si-Mg eutectic alloy Q Cai, B Cantor, VS Tong, F Wang, CL Mendis, ITH Chang, Z Fan Metals 12 (1), 7, 2021 | 5 | 2021 |
| EBSD Characterisation of Heterogeneous Microstructures in Zirconium Alloys VS Tong Imperial College London, 2016 | 4 | 2016 |
| Understanding plasticity in zirconium using in-situ measurement of lattice rotations V Tong, E Wielewski, B Britton arXiv preprint arXiv:1910.04187, 2019 | 3 | 2019 |
| Stress-strain engineering of single-crystalline silicon membranes by ion implantation: Towards direct-gap group-IV semiconductors MG Masteghin, V Tong, EB Schneider, CCL Underwood, T Peach, ... Physical Review Materials 5 (12), 124603, 2021 | 2 | 2021 |
