| Occupancy estimation for smart buildings by an auto-regressive hidden Markov model B Ai, Z Fan, RX Gao 2014 American Control Conference, 2234-2239, 2014 | 85 | 2014 |
| The optimal drift-compensatory and fault tolerant approach for mixed-product run-to-run control B Ai, Y Zheng, SS Jang, Y Wang, L Ye, C Zhou Journal of Process Control 19 (8), 1401-1412, 2009 | 30 | 2009 |
| An EWMA algorithm with a cycled resetting (CR) discount factor for drift and fault of high-mix run-to-run control Y Zheng, B Ai, DSH Wong, SS Jang, Y Wang, J Zhang IEEE Transactions on Industrial Informatics 6 (2), 229-242, 2010 | 27 | 2010 |
| Cycle forecasting EWMA (CF-EWMA) approach for drift and fault in mixed-product run-to-run process B Ai, Y Zheng, Y Wang, SS Jang, T Song Journal of Process Control 20 (5), 689-708, 2010 | 22 | 2010 |
| Stability and Performance Analysis of Time-Delayed Actuator Control Systems B Ai, L Sentis, N Paine, S Han, A Mok, CL Fok Journal of Dynamic Systems, Measurement, and Control 138 (5), 051005: 1-20, 2016 | 21 | 2016 |
| Stability Analysis of EWMA Run-to-Run Controller Subjects to Stochastic Metrology Delay B Ai, DSH Wong, SS Jang, Y Zheng The 18th IFAC World Congress 44 (1), 12354-12359, 2011 | 7 | 2011 |
| Stability analysis of semiconductor manufacturing process with EWMA run-to-run controllers B Ai, DSH Wong, SS Jang arXiv preprint arXiv:1510.08946, 2015 | 2 | 2015 |
| Cycle prediction EWMA run-to-run controller for mixed-product drifting process B Ai, Y Zheng, H Zhang, Z Wang, Z Zhang Decision and Control, Proceedings of the 48th IEEE Conference on, 1908-1913, 2009 | 2 | 2009 |
| A fault-tolerant algorithm with cycled resetting discount factor in semiconductor manufacturing industry B Ai, Y Zheng, Z Zhang 2009 IEEE International Conference on Control and Automation, 483-488, 2009 | 2 | 2009 |
| The dEWMA fault tolerant approach for mixed product run-to-run control Y Zheng, B Ai, Y Wang, H Zhang 2009 IEEE International Symposium on Industrial Electronics, 155-160, 2009 | 2 | 2009 |
| Stability and Performance Analysis of Semiconductor Manufacturing Process with Exponentially Weighted Moving Average Controllers B Ai Huazhong University of Science and Technology, 2012 | | 2012 |
| EWMA for run-to-run control with time-varying discount factor in high-mix process M HOU, Y ZHENG, B AI, Y ZHENG, J ZHANG Control Theory & Applications 26 (10), 1137-1142, 2009 | | 2009 |
| An EWMA algorithm with cycled resetting (CR) discount factor to deal with disturbance in high-mix run-to-run control Y Zheng, B Ai, Y Zheng, L Ye Chinese Journal of Scientific Instrument (in Chinese) 30 (6), 419-424, 2009 | | 2009 |
| Combinatory feed-forward/feedback run torun control of mixed products Y Zheng, B Ai, J Zhang, Y Wang Journal of Huazhong University of Science and Technology (Natural Science …, 2009 | | 2009 |
wong dshnational tsing hua university在 che.nthu.edu.tw 的电子邮件经过验证
