| Free Lunch for Testing: Fuzzing Deep-Learning Libraries from Open Source A Wei, Y Deng, C Yang, L Zhang 2022 IEEE/ACM 44th International Conference on Software Engineering (ICSE), 2022 | 67 | 2022 |
| A large-scale longitudinal study of flaky tests W Lam, S Winter, A Wei, T Xie, D Marinov, J Bell Proceedings of the ACM on Programming Languages 4 (OOPSLA), 1-29, 2020 | 52 | 2020 |
| AMOS: enabling automatic mapping for tensor computations on spatial accelerators with hardware abstraction S Zheng, R Chen, A Wei, Y Jin, Q Han, L Lu, B Wu, X Li, S Yan, Y Liang Proceedings of the 49th Annual International Symposium on Computer …, 2022 | 41 | 2022 |
| Fuzzing deep-learning libraries via automated relational api inference Y Deng, C Yang, A Wei, L Zhang Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022 | 40 | 2022 |
| Domain-specific fixes for flaky tests with wrong assumptions on underdetermined specifications P Zhang, Y Jiang, A Wei, V Stodden, D Marinov, A Shi 2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE …, 2021 | 32* | 2021 |
| Probabilistic and systematic coverage of consecutive test-method pairs for detecting order-dependent flaky tests A Wei, P Yi, T Xie, D Marinov, W Lam Tools and Algorithms for the Construction and Analysis of Systems: 27th …, 2021 | 20 | 2021 |
| Preempting flaky tests via non-idempotent-outcome tests A Wei, P Yi, Z Li, T Xie, D Marinov, W Lam Proceedings of the 44th International Conference on Software Engineering …, 2022 | 19 | 2022 |
| Neoflow: A flexible framework for enabling efficient compilation for high performance dnn training S Zheng, R Chen, Y Jin, A Wei, B Wu, X Li, S Yan, Y Liang IEEE Transactions on Parallel and Distributed Systems 33 (11), 3220-3232, 2021 | 11 | 2021 |
| Finding polluter tests using Java PathFinder P Yi, A Wei, W Lam, T Xie, D Marinov ACM SIGSOFT Software Engineering Notes 46 (3), 37-41, 2021 | 6 | 2021 |
| PBA: Percentile-Based Level Allocation for Multiple-Bits-Per-Cell RRAM A Wei, A Levy, P Yi, RM Radway, P Raina, S Mitra, S Achour 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-9, 2023 | 1 | 2023 |
