Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain U Guin, K Huang, D DiMase, JM Carulli, M Tehranipoor, Y Makris Proceedings of the IEEE 102 (8), 1207-1228, 2014 | 634 | 2014 |
Hardware Trojan detection through golden chip-free statistical side-channel fingerprinting Y Liu, K Huang, Y Makris Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 140 | 2014 |
Parametric counterfeit IC detection via support vector machines K Huang, JM Carulli, Y Makris 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012 | 99 | 2012 |
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry K Huang, JM Carulli, Y Makris 2013 IEEE International Test Conference (ITC), 1-4, 2013 | 72 | 2013 |
Recycled IC Detection Based on Statistical Methods K Huang, Y Liu, N Korolija, JM Carulli, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 66 | 2015 |
Ecological driving system for connected/automated vehicles using a two-stage control hierarchy K Huang, X Yang, Y Lu, CC Mi, P Kondlapudi IEEE Transactions on Intelligent Transportation Systems 19 (7), 2373-2384, 2018 | 64 | 2018 |
Fault diagnosis of analog circuits based on machine learning K Huang, HG Stratigopoulos, S Mir 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 61 | 2010 |
Eco-driving system for connected automated vehicles: Multi-objective trajectory optimization XT Yang, K Huang, Z Zhang, ZA Zhang, F Lin IEEE Transactions on Intelligent Transportation Systems 22 (12), 7837-7849, 2020 | 59 | 2020 |
Diagnosis of local spot defects in analog circuits K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012 | 59 | 2012 |
Reconciling the IC test and security dichotomy O Sinanoglu, N Karimi, J Rajendran, R Karri, Y Jin, K Huang, Y Makris 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 41 | 2013 |
Spatial correlation modeling for probe test cost reduction in RF devices N Kupp, K Huang, JM Carulli Jr, Y Makris Proceedings of the International Conference on Computer-Aided Design, 23-29, 2012 | 36 | 2012 |
Spatial estimation of wafer measurement parameters using gaussian process models N Kupp, K Huang, J Carulli, Y Makris 2012 IEEE International Test Conference, 1-8, 2012 | 36 | 2012 |
Concurrent hardware Trojan detection in wireless cryptographic ICs Y Liu, G Volanis, K Huang, Y Makris 2015 IEEE International Test Conference (ITC), 1-8, 2015 | 34 | 2015 |
A comparative study of one-shot statistical calibration methods for analog/RF ICs Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris 2015 IEEE International Test Conference (ITC), 1-10, 2015 | 33 | 2015 |
Real-time prediction for IC aging based on machine learning K Huang, X Zhang, N Karimi IEEE Transactions on Instrumentation and Measurement 68 (12), 4756-4764, 2019 | 29 | 2019 |
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests K Huang, N Kupp, JM Carulli, Y Makris 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 553-558, 2013 | 27 | 2013 |
Process monitoring through wafer-level spatial variation decomposition K Huang, N Kupp, JM Carulli, Y Makris 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 23 | 2013 |
FaceSigns: Semi-Fragile Neural Watermarks for Media Authentication and Countering Deepfakes P Neekhara, S Hussain, X Zhang, K Huang, J McAuley, F Koushanfar arXiv preprint arXiv:2204.01960, 2022 | 18 | 2022 |
Low-cost analog/RF IC testing through combined intra-and inter-die correlation models K Huang, N Kupp, C Xanthopoulos, JM Carulli, Y Makris IEEE Design & Test 32 (1), 53-60, 2014 | 17 | 2014 |
On the Application of Binary Neural Networks in Oblivious Inference M Samragh, S Hussain, X Zhang, K Huang, F Koushanfar Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 16 | 2021 |