| A review on fault detection and process diagnostics in industrial processes YJ Park, SKS Fan, CY Hsu Processes 8 (9), 1123, 2020 | 179 | 2020 |
| Semiconductor fault detection and classification for yield enhancement and manufacturing intelligence CF Chien, CY Hsu, PN Chen Flexible Services and Manufacturing Journal 25, 367-388, 2013 | 136 | 2013 |
| Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing CY Hsu, WC Liu Journal of Intelligent Manufacturing 32 (3), 823-836, 2021 | 125 | 2021 |
| Data-driven approach for fault detection and diagnostic in semiconductor manufacturing SKS Fan, CY Hsu, DM Tsai, F He, CC Cheng IEEE Transactions on Automation Science and Engineering 17 (4), 1925-1936, 2020 | 118 | 2020 |
| Manufacturing intelligence to forecast and reduce semiconductor cycle time CF Chien, CY Hsu, CW Hsiao Journal of Intelligent Manufacturing 23, 2281-2294, 2012 | 102 | 2012 |
| Development of a cloud-based service framework for energy conservation in a sustainable intelligent transportation system CY Hsu, CS Yang, LC Yu, CF Lin, HH Yao, DY Chen, KR Lai, PC Chang International Journal of Production Economics 164, 454-461, 2015 | 95 | 2015 |
| Agent-based fuzzy constraint-directed negotiation mechanism for distributed job shop scheduling CY Hsu, BR Kao, KR Lai Engineering Applications of Artificial Intelligence 53, 140-154, 2016 | 61 | 2016 |
| Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes SKS Fan, CY Hsu, CH Jen, KL Chen, LT Juan Advanced Engineering Informatics 46, 101166, 2020 | 57 | 2020 |
| Real Time Monitoring System and Method Thereof of Optical Film Manufacturing Process CY Hsu, T Chien, KH Lai, CL Chan US Patent App. 14/970,262, 2017 | 55 | 2017 |
| An autoencoder gated recurrent unit for remaining useful life prediction YW Lu, CY Hsu, KC Huang Processes 8 (9), 1155, 2020 | 53 | 2020 |
| Similarity matching of wafer bin maps for manufacturing intelligence to empower industry 3.5 for semiconductor manufacturing CY Hsu, WJ Chen, JC Chien Computers & Industrial Engineering 142, 106358, 2020 | 53 | 2020 |
| Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller CF Chien, YJ Chen, CY Hsu, HK Wang IEEE Transactions on Automation Science and Engineering 11 (2), 473-484, 2013 | 53 | 2013 |
| Overall wafer effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole CF Chien, CY Hsu, KH Chang Computers & Industrial Engineering 65 (1), 117-127, 2013 | 53 | 2013 |
| UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing CF Chien, CY Hsu Journal of Intelligent Manufacturing 22, 399-412, 2011 | 51 | 2011 |
| Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification CY Hsu, JC Chien Journal of Intelligent Manufacturing 33 (3), 831-844, 2022 | 49 | 2022 |
| A genetic algorithm for the multi-objective optimization of mixed-model assembly line based on the mental workload X Zhao, CY Hsu, PC Chang, L Li Engineering Applications of Artificial Intelligence 47, 140-146, 2016 | 45 | 2016 |
| A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing CF Chien, CY Hsu Journal of Intelligent Manufacturing 17, 429-439, 2006 | 43 | 2006 |
| An agent-based fuzzy constraint-directed negotiation model for solving supply chain planning and scheduling problems CY Hsu, BR Kao, L Li, KR Lai Applied Soft Computing 48, 703-715, 2016 | 35 | 2016 |
| Data mining for optimizing IC feature designs to enhance overall wafer effectiveness CF Chien, CY Hsu IEEE Transactions on Semiconductor Manufacturing 27 (1), 71-82, 2013 | 35 | 2013 |
| Temporal convolution-based long-short term memory network with attention mechanism for remaining useful life prediction CY Hsu, YW Lu, JH Yan IEEE Transactions on Semiconductor Manufacturing 35 (2), 220-228, 2022 | 33 | 2022 |
