| Comparison of electromagnetic field solvers for the 3D analysis of plasmonic nanoantennas J Hoffmann, C Hafner, P Leidenberger, J Hesselbarth, S Burger Modeling Aspects in Optical Metrology II 7390, 174-184, 2009 | 94 | 2009 |
| Metas. UncLib—A measurement uncertainty calculator for advanced problems M Zeier, J Hoffmann, M Wollensack Metrologia 49 (6), 809, 2012 | 84 | 2012 |
| VNA Tools II: S-parameter uncertainty calculation M Wollensack, J Hoffmann, J Ruefenacht, M Zeier 79th ARFTG Microwave Measurement Conference, 1-5, 2012 | 74 | 2012 |
| A calibration algorithm for nearfield scanning microwave microscopes J Hoffmann, M Wollensack, M Zeier, J Niegemann, HP Huber, ... 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO), 1-4, 2012 | 46 | 2012 |
| Pin gap investigations for the 1.85 mm coaxial connector JP Hoffmann, P Leuchtmann, R Vahldieck 2007 European Microwave Conference, 388-391, 2007 | 38 | 2007 |
| Measuring low loss dielectric substrates with scanning probe microscopes J Hoffmann, G Gramse, J Niegemann, M Zeier, F Kienberger Applied Physics Letters 105 (1), 2014 | 37 | 2014 |
| Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz M Kasper, G Gramse, J Hoffmann, C Gaquiere, R Feger, A Stelzer, ... Journal of Applied Physics 116 (18), 2014 | 23 | 2014 |
| METAS VNA Tools II-Math Reference V2. M Wollensack, J Hoffmann Metrol. METAS, 2013 | 23* | 2013 |
| S-parameters of slotted and slotless coaxial connectors JP Hoffmann, P Leuchtman, J Ruefenacht, K Wong 2009 74th ARFTG Microwave Measurement Conference, 1-5, 2009 | 23 | 2009 |
| A stable bayesian vector network analyzer calibration algorithm J Hoffmann, P Leuchtmann, J Ruefenacht, R Vahldieck IEEE Transactions on Microwave Theory and Techniques 57 (4), 869-880, 2009 | 22 | 2009 |
| Scanning microwave microscopy applied to semiconducting GaAs structures A Buchter, J Hoffmann, A Delvallée, E Brinciotti, D Hapiuk, C Licitra, ... Review of Scientific Instruments 89 (2), 2018 | 21 | 2018 |
| Improving VNA measurement accuracy by including connector effects in the models of calibration standards K Wong, J Hoffmann 82nd ARFTG Microwave Measurement Conference, 1-7, 2013 | 21 | 2013 |
| Establishing traceability for the measurement of scattering parameters in coaxial line systems M Zeier, J Hoffmann, P Hürlimann, J Rüfenacht, D Stalder, M Wollensack Metrologia 55 (1), S23, 2018 | 20 | 2018 |
| Over-determined offset short calibration of a VNA JP Hoffmann, P Leuchtmann, R Vahldieck 2008 71st ARFTG Microwave Measurement Conference, 1-4, 2008 | 19 | 2008 |
| Computing uncertainties of S-parameters by means of monte carlo simulation JP Hoffmann, P Leuchtmann, J Schaub, RÜ Vahldieck 2007 69th ARFTG Conference, 1-7, 2007 | 18 | 2007 |
| Comparison of 1.85 mm line reflect line and offset short calibration JP Hoffmann, J Ruefenacht, M Wollensack, M Zeier 2010 76th ARFTG Microwave Measurement Conference, 1-7, 2010 | 15 | 2010 |
| Propagation constant of a coaxial transmission line with rough surfaces J Hoffmann, P Leuchtmann, J Ruefenacht, C Hafner IEEE Transactions on microwave theory and techniques 57 (12), 2914-2922, 2009 | 15 | 2009 |
| Standard load method: A new calibration technique for material characterization at terahertz frequencies A Kazemipour, J Hoffmann, M Wollensack, M Hudlička, J Rüfenacht, ... IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021 | 14 | 2021 |
| Analytical uncertainty evaluation of material parameter measurements at THz frequencies A Kazemipour, M Wollensack, J Hoffmann, M Hudlička, SK Yee, ... Journal of Infrared, Millimeter, and Terahertz Waves 41, 1199-1217, 2020 | 13 | 2020 |
| Measurement uncertainty in battery electrochemical impedance spectroscopy A Moradpour, M Kasper, J Hoffmann, F Kienberger IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2022 | 12 | 2022 |
