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Justin Sobas
Justin Sobas
PhD student université Bordeaux
在 u-bordeaux.fr 的电子邮件经过验证
标题
引用次数
引用次数
年份
Degradation Measurement and Modelling under Ageing in a 16 nm FinFET FPGA
J Sobas, F Marc
Micromachines 15 (1), 2023
42023
Aging measurement and empirical modeling of BTI on FPGA using 16 nm FinFETs for static and dynamic stresses
J Sobas, F Marc
Microelectronics Reliability 150, 115065, 2023
22023
Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA
J Sobas, TB Airimitoaie, F Marc
Microelectronics Reliability 138, 114698, 2022
22022
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