| A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design C Thibeault, Y Hariri, SR Hasan, C Hobeika, Y Savaria, Y Audet, FZ Tazi Journal of Electronic Testing 29, 457-471, 2013 | 15 | 2013 |
| 3DSDM: A 3 data-source diagnostic method Y Hariri, C Thibeault Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003 | 9 | 2003 |
| BARVINN: Arbitrary precision DNN accelerator controlled by a RISC-V CPU M Askarihemmat, S Wagner, O Bilaniuk, Y Hariri, Y Savaria, JP David Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 8 | 2023 |
| : Improving Current-Based Testing and Diagnosis Through Modified Test Pattern Generation C Thibeault, Y Hariri IEEE transactions on very large scale integration (VLSI) systems 19 (1), 130-141, 2009 | 6 | 2009 |
| Improving a 3 data-source diagnostic method Y Hariri, C Thibeault 2006 IEEE North-East Workshop on Circuits and Systems, 149-152, 2006 | 5 | 2006 |
| Bridging fault diagnostic tool based on ΔIDDQ probabilistic signatures, circuit layout parasitics and logic errors Y Hariri, C Thibeault IET Computers & Digital Techniques 1 (6), 694-705, 2007 | 2 | 2007 |
| Redefining the role of functional testing C Thibeault, D Tremblay, Y Hariri 2006 IEEE North-East Workshop on Circuits and Systems, 133-136, 2006 | 2 | 2006 |
| Amélioration de la méthode de diagnostic basée sur les signatures probabilistes de AIDDQ Y Hariri École de technologie supérieure, 2002 | 2 | 2002 |
| On captureless delay test points C Thibeault, Y Hariri, C Hobeika 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA …, 2009 | 1 | 2009 |
| Improving the time response of mems switches for rf applications M El-Asmar, Y Hariri, F Domingue, V Nerguizian 2006 Canadian Conference on Electrical and Computer Engineering, 344-347, 2006 | 1 | 2006 |
| Tester memory requirements and test application time reduction for delay faults with Digital Captureless test Sensors C Thibeault, Y Hariri, C Hobeika Journal of Electronic Testing 28, 229-242, 2012 | | 2012 |
| Étude de faisabilité d'une méthodologie de test exploitant le test par le courant IDDQ, et l'intéraction d'autres méthodes de test de diagnostic Y Hariri École de technologie supérieure, 2008 | | 2008 |
| Étude de faisabilité d'une méthodologie de test exploitant le test par le courant IDDQ, et l'intéraction d'autres méthodes de test de diagnostic. Y Hariri École de technologie supérieure, Montréal, 2008 | | 2008 |
| Étude de faisabilité d'une méthodologie de test exploitant le test par le courant I [indice] D [indice] D [indice] Q, et l'intéraction d'autres méthodes de test et de diagnostic. Y Hariri Library and Archives Canada= Bibliothèque et Archives Canada, Ottawa, 2008 | | 2008 |
| Feasibility study for a test methodology by exploiting the current IDDQ test, and the interaction of other methods of testing and diagnosis Y Hariri Dissertation Abstracts International 69 (01), 2008 | | 2008 |
| Improvement of a diagnosis method based on current probabilistic signatures (French text) Y Hariri | | 2003 |
| Energy Harvesting A Novel Asynchronous Pixel for an Energy Harvesting CMOS Image Sensor.......... C. Shi, MK Law, and A. Bermak 118 Testing: Improving Current-Based Testing and … C Thibeault, Y Hariri | | |
