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Tsai Chun Hsiung
Tsai Chun Hsiung
Taiwan Semiconductor Manufacturing Company
在 ntu.edu.tw 的电子邮件经过验证
标题
引用次数
引用次数
年份
Mechanism of forming a trench structure
CH Tsai, SH Syue, Z Fang
US Patent 9,396,986, 2016
4392016
FinFET structure and method for manufacturing thereof
CH Tsai, NI Chun-Lung, KW Chen
US Patent 9,515,072, 2016
4272016
FinFETs and methods of forming FinFETs
CH Tsai, TC Wang
US Patent 9,558,946, 2017
4182017
Methods for doping fin field-effect transistors
CH Tsai, YL Huang, YU De-Wei
US Patent 9,209,280, 2015
2232015
Techniques for FinFET doping
CH Tsai, C Chien-Tai, MR Yeh, DW Lin
US Patent 8,785,286, 2014
802014
FinFET LDD and source drain implant technique
CH Tsai, CC Su, TH Li, DW Lin, WS Huang
US Patent 8,557,692, 2013
742013
Methods for doping fin field-effect transistors
CH Tsai, YL Huang, YU De-Wei
US Patent 8,980,719, 2015
712015
Mechanisms for doping lightly-doped-drain (LDD) regions of finFET devices
CH Tsai, TC Wang, LIU Su-Hao
US Patent 9,029,226, 2015
702015
Method for forming epitaxial feature
YH Cheng, TM Kwok, CH Tsai, JJ Xu
US Patent 9,142,643, 2015
692015
Mechanism for FinFET well doping
CH Tsai, YT Lin, CH Wann
US Patent 9,406,546, 2016
672016
Self-aligned dual-metal silicide and germanide formation
CH Wann, SP Sun, LY Yeh, C Shih, LC Yu, CH Tsai, CH Lin, NK Chen, ...
US Patent 9,214,556, 2015
562015
Formation of dislocations in source and drain regions of FinFET devices
CH Tsai, WY Lu, C Chien-Tai, WY Lee, DW Lin
US Patent 9,293,534, 2016
552016
Methods of anneal after deposition of gate layers
CH Tsai, XF Yu, YL Huang, DW Lin
US Patent 8,809,175, 2014
522014
Epitaxial formation of source and drain regions
CH Tsai, YF Pai
US Patent 9,012,310, 2015
472015
Contact resistance reduction technique
CH Tsai, MT Chen
US Patent 9,543,438, 2017
462017
Asymmetric cyclic desposition etch epitaxy
CH Tsai, YF Pai, CC Su, T Tseng, MY Liu
US Patent 8,906,789, 2014
432014
Epitaxial growth of doped film for source and drain regions
CH Tsai, JA Ke, TY Chen, CK Wang
US Patent 8,877,592, 2014
432014
Semiconductor structure and manufacturing method thereof
CH Tsai, KF Yu, KW Chen
US Patent 9,978,866, 2018
422018
High surface dopant concentration semiconductor device and method of fabricating
YL Huang, MR Yeh, CH Tsai, TH Lee, DW Lin, TM Kwok
US Patent 8,278,196, 2012
412012
Asymmetric cyclic depositon and etch process for epitaxial formation mechanisms of source and drain regions
CH Tsai, TY Chen, JA Ke
US Patent 9,093,468, 2015
362015
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