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ELENA PASCUAL CORRAL
ELENA PASCUAL CORRAL
Profesora Titular de Universidad (Universidad de Salamanca)
在 usal.es 的电子邮件经过验证
标题
引用次数
引用次数
年份
Influence of the substrate on the diffusion coefficient and the momentum relaxation in graphene: The role of surface polar phonons
R Rengel, E Pascual, MJ Martín
Applied Physics Letters 104 (23), 2014
582014
Clarithromycin-induced leukocytoclastic vasculitis
T De Vega, S Blanco, C Lopez, E Pascual, M Sanchez, A Zamarron
European Journal of Clinical Microbiology and Infectious Diseases 12, 563-563, 1993
351993
Hot carrier and hot phonon coupling during ultrafast relaxation of photoexcited electrons in graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Applied Physics Letters 108 (4), 2016
332016
Injected current and quantum transmission coefficient in low Schottky barriers: WKB and Airy approaches
R Rengel, E Pascual, MJ Martin
IEEE electron device letters 28 (2), 171-173, 2007
202007
Experiences on the design, creation, and analysis of multimedia content to promote active learning
R Rengel, E Pascual, I Íñiguez-de-la-Torre, MJ Martín, BG Vasallo
Journal of Science Education and Technology 28, 445-451, 2019
182019
RF dynamic and noise performance of Metallic Source/Drain SOI n-MOSFETs
MJ Martin, E Pascual, R Rengel
Solid-state electronics 73, 64-73, 2012
182012
Carrier-carrier and carrier-phonon interactions in the dynamics of photoexcited electrons in graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Journal of Physics: Conference Series 647 (1), 012003, 2015
172015
Enhanced carrier injection in Schottky contacts using dopant segregation: a Monte Carlo research
E Pascual, MJ Martín, R Rengel, G Larrieu, E Dubois
Semiconductor science and technology 24 (2), 025022, 2009
172009
Microscopic modelling of reverse biased Schottky diodes: influence of non-equilibrium transport phenomena
E Pascual, R Rengel, MJ Martín
Semiconductor science and technology 22 (9), 1003, 2007
152007
Monte Carlo study of dopant-segregated Schottky barrier SoI MOSFETs: Enhancement of the RF performance
MJ Martin-Martinez, C Couso, E Pascual, R Rengel
IEEE Transactions on Electron Devices 61 (12), 3955-3961, 2014
122014
Substrate influence on the early relaxation stages of photoexcited carriers in monolayer graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Applied Surface Science 424, 52-57, 2017
112017
Effect of charged impurity scattering on the electron diffusivity and mobility in graphene
R Rengel, JM Iglesias, E Pascual, MJ Martin
Journal of Physics: Conference Series 647 (1), 012046, 2015
92015
Electronic transport and noise characterization in MoS2
E Pascual, JM Iglesias, MJ Martín, R Rengel
Semiconductor Science and Technology 35 (5), 055021, 2020
72020
Interplay of out-of-equilibrium phonons and self-heating under high field transport conditions in graphene
JM Iglesias, R Rengel, E Pascual, MJ Martín
Journal of Physics D: Applied Physics 50 (30), 305101, 2017
62017
A balance equations approach for the study of the dynamic response and electronic noise in graphene
R Rengel, JM Iglesias, E Pascual, MJ Martín
Journal of Applied Physics 121 (18), 2017
52017
Noise temperature in graphene at high frequencies
R Rengel, JM Iglesias, E Pascual, MJ Martín
Semiconductor Science and Technology 31 (7), 075001, 2016
52016
A Monte Carlo investigation of carrier transport in fabricated back‐to‐back Schottky diodes: Influence of direct quantum tunnelling and temperature
E Pascual, R Rengel, N Reckinger, X Tang, V Bayot, E Dubois, MJ Martín
physica status solidi c 5 (1), 119-122, 2008
52008
Monte Carlo analysis of tunneling and thermionic transport in a reverse biased Schottky diode
E Pascual, R Rengel, MJ Martin
2007 Spanish Conference on Electron Devices, 108-111, 2007
52007
Monte Carlo study of noise velocity fluctuations and microscopic carrier transport in monolayer transition metal dichalcogenides
R Rengel, Ó Castelló, E Pascual, MJ Martín, JM Iglesias
Journal of Physics D: Applied Physics 53 (39), 395102, 2020
42020
Interband scattering-induced ambipolar transport in graphene
JM Iglesias, E Pascual, MJ Martín, R Rengel
Semiconductor Science and Technology 34 (6), 065011, 2019
42019
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