| hyperspy/hyperspy: Release v1. 7.0 F De La Peña, E Prestat, V Tonaas Fauske, P Burdet, J Lähnemann, ... Zenodo, 2022 | 250* | 2022 |
| Electron microscopy (big and small) data analysis with the open source software package HyperSpy F de la Peña, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ... Microscopy and Microanalysis 23 (S1), 214-215, 2017 | 93 | 2017 |
| Improving microstructural quantification in FIB/SEM nanotomography JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-Riba Ultramicroscopy 184 (A), 24, 2018 | 60 | 2018 |
| Near-field optical properties of fully alloyed noble metal nanoparticles C Gong, MRS Dias, GC Wessler, JA Taillon, LG Salamanca-Riba, ... Adv. Opt. Mater 5 (1), 1600568, 2017 | 54 | 2017 |
| Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO2 metal-oxide-semiconductor field-effect transistors JA Taillon, J Hyuk Yang, CA Ahyi, J Rozen, JR Williams, LC Feldman, ... Journal of Applied Physics 113 (4), 2013 | 45 | 2013 |
| Long-term Cr poisoning effect on LSCF-GDC composite cathodes sintered at different temperatures C Xiong, JA Taillon, C Pellegrinelli, YL Huang, LG Salamanca-Riba, ... Journal of The Electrochemical Society 163 (9), F1091, 2016 | 33 | 2016 |
| Towards a fundamental understanding of the cathode degradation mechanisms ED Wachsman, YL Huang, C Pellegrinelli, JA Taillon, ... ECS Transactions 61 (1), 47, 2014 | 20 | 2014 |
| Characterization of zinc carboxylates in an oil paint test panel C Romano, T Lam, GA Newsome, JA Taillon, N Little, J Tsang Studies in Conservation 65 (1), 14-27, 2020 | 18 | 2020 |
| NexusLIMS: a laboratory information management system for shared-use electron microscopy facilities JA Taillon, TF Bina, RL Plante, MW Newrock, GR Greene, JW Lau Microscopy and Microanalysis 27 (3), 511-527, 2021 | 14 | 2021 |
| Boron-doped few-walled carbon nanotubes: novel synthesis and properties C Preston, D Song, JA Taillon, J Cumings, L Hu Nanotechnology 27 (44), 445601, 2016 | 14 | 2016 |
| Investigating the relationship between operating conditions and SOFC cathode degradation C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ... ECS Transactions 68 (1), 773, 2015 | 12 | 2015 |
| Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO2 interfaces using HRTEM and STEM-EELS JA Taillon, CJ Klingshirn, C Jiao, Y Zheng, S Dhar, TS Zheleva, AJ Lelis, ... Applied Physics Letters 113, 193503, 2018 | 6 | 2018 |
| Advanced analytical microscopy at the nanoscale: Applications in wide bandgap and solid oxide fuel cell materials JA Taillon University of Maryland, College Park, 2016 | 6 | 2016 |
| A study of SOFC cathode degradation in H2O environments C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ... ECS Transactions 64 (2), 17, 2014 | 6 | 2014 |
| Three dimensional microstructural characterization of cathode degradation in SOFCs using focused ion beam and SEM JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-Riba ECS Transactions 61 (1), 109, 2014 | 6 | 2014 |
| Harvesting microscopy experimental context with a configurable laboratory information management system JA Taillon, RF Devers, RL Plante, MW Newrock, JW Lau, G Greene Microscopy and Microanalysis 25 (S2), 140-141, 2019 | 4 | 2019 |
| Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM JA Taillon, C Pellegrinelli, Y Huang, E Wachsman, L Salamanca-Riba Microscopy and Microanalysis 21, 2161, 2015 | 4 | 2015 |
| Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS JA Taillon, K Gaskell, G Liu, L Feldman, S Dahr, T Zheleva, A Lelis, ... Microscopy and Microanalysis 21, 1537, 2015 | 4 | 2015 |
| Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers JA Taillon, V Ray, LG Salamanca-Riba Microscopy and Microanalysis 23 (4), 872-877, 2017 | 3 | 2017 |
| NexusLIMS: Leveraging Shared Microscopy Resources for Data Analysis with a Configurable Laboratory Information Management System J Taillon, R Plante, M Newrock, J Lau, G Greene Microscopy and Microanalysis, 2020 | 2 | 2020 |
Lourdes G Salamanca-RibaUniversity of Maryland在 umd.edu 的电子邮件经过验证
