| Test data analytics—Exploring spatial and test-item correlations in production test data CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 44 | 2013 |
| Fast Dimensional Analysis for Root Cause Investigation in Large-Scale Service Environment F Lin, K Muzumdar, NP Laptev, MV Curelea, S Lee, S Sankar ACM SIGMETRICS, 2020 | 43 | 2020 |
| Hardware Remediation At Scale FF Lin, M Beadon, HD Dixit, G Vunnam, A Desai, S Sankar IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018 | 17 | 2018 |
| An artificial neural network approach for screening test escapes F Lin, KT Cheng 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 414-419, 2017 | 17 | 2017 |
| Learning from production test data: Correlation exploration and feature engineering F Lin, CK Hsu, KT Cheng 2014 IEEE 23rd Asian Test Symposium, 236-241, 2014 | 16 | 2014 |
| Feature engineering with canonical analysis for effective statistical tests screening test escapes F Lin, CK Hsu, KT Cheng 2014 International Test Conference, 1-10, 2014 | 15 | 2014 |
| Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction S Zhang, F Lin, CK Hsu, KT Cheng, H Wang 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014 | 14 | 2014 |
| Predicting Remediations for Hardware Failures in Large-Scale Datacenters F Lin, A Davoli, I Akbar, S Kalmanje, L Silva, J Stamford, Y Golany, ... IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2020 | 13 | 2020 |
| Adatest: An efficient statistical test framework for test escape screening F Lin, CK Hsu, KT Cheng 2015 IEEE International Test Conference (ITC), 1-8, 2015 | 13 | 2015 |
| Near-Realtime Server Reboot Monitoring and Root Cause Analysis in a Large-Scale System F Lin, B Bolla, E Pinkham, N Kodner, D Moore, A Desai, S Sankar | 6* | |
| Pairwise proximity-based features for test escape screening F Lin, CK Hsu, AG Busetto, KT Cheng 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 300-306, 2015 | 5 | 2015 |
| Optimizing Interrupt Handling Performance for Memory Failures in Large Scale Data Centers HD Dixit, F Lin, B Holland, M Beadon, Z Yang, S Sankar ACM/SPEC International Conference on Performance Engineering, 2020 | 2 | 2020 |
| Hard disk drive failure analysis and prediction: an industry view Z Miller, O Medaiyese, M Ravi, A Beatty, F Lin 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems …, 2023 | 1 | 2023 |
| PVF (Parameter Vulnerability Factor): A Quantitative Metric Measuring AI Vulnerability and Resilience Against Parameter Corruptions X Jiao, F Lin, HD Dixit, J Coburn, A Pandey, H Wang, J Huang, V Ramesh, ... arXiv preprint arXiv:2405.01741, 2024 | | 2024 |
| Dr. DNA: Combating Silent Data Corruptions in Deep Learning using Distribution of Neuron Activations D Ma, F Lin, A Desmaison, J Coburn, D Moore, S Sankar, X Jiao Proceedings of the 29th ACM International Conference on Architectural …, 2024 | | 2024 |
| Evaluating Robustness of Deep Learning-based Recommendation Systems against Hardware Errors: A Case Study SS Xun Jiao, Fred Lin, Matt Xiao, Alban Desmaison, Daniel Moore IEEE Real-Time Systems Symposium, 2023 | | 2023 |
| Industry Track Programme Committee DSN 2021 N Kanekawa, HV Ramasamy, R Bertrand, L Di Martino, M Hiltunen, ... | | |
| Industry Track Programme Committee DSN 2020 F Brancati, C Constantinescu, J Currey, L Di Martino, J Lala, B Hall, ... | | |
