Yet Another Textual Variability Language? A Community Effort Towards a Unified Language C Sundermann, K Feichtinger, D Engelhardt, R Rabiser, T Thüm Proceedings of the 25th ACM International Systems and Software Product Line …, 2021 | 49 | 2021 |
Evaluating #SAT solvers on industrial feature models C Sundermann, T Thüm, I Schaefer Proceedings of the 14th International Working Conference on Variability …, 2020 | 47 | 2020 |
Applications of #SAT Solvers on Feature Models C Sundermann, M Nieke, PM Bittner, T Heß, T Thüm, I Schaefer 15th International Working Conference on Variability Modelling of Software …, 2021 | 31 | 2021 |
SMT-Based Variability Analyses in FeatureIDE J Sprey, C Sundermann, S Krieter, M Nieke, J Mauro, T Thüm, I Schaefer Proceedings of the 14th International Working Conference on Variability …, 2020 | 23 | 2020 |
On the scalability of building binary decision diagrams for current feature models T Heß, C Sundermann, T Thüm Proceedings of the 25th ACM International Systems and Software Product Line …, 2021 | 18 | 2021 |
Tseitin or not Tseitin? The Impact of CNF Transformations on Feature-Model Analyses E Kuiter, S Krieter, C Sundermann, T Thüm, G Saake 37th IEEE/ACM International Conference on Automated Software Engineering, 1-13, 2022 | 14 | 2022 |
Evaluating State-of-the-Art #SAT Solvers on Industrial Configuration Spaces C Sundermann, T Heß, M Nieke, PM Bittner, JM Young, T Thüm, ... Empirical Software Engineering 28 (2), 1-38, 2023 | 11 | 2023 |
Integration of UVL in FeatureIDE C Sundermann, T Heß, D Engelhardt, R Arens, J Herschel, K Jedelhauser, ... Proceedings of the 25th ACM International Systems and Software Product Line …, 2021 | 11 | 2021 |
Quantifying the variability mismatch between problem and solution space M Hentze, C Sundermann, T Thüm, I Schaefer Proceedings of the 25th International Conference on Model Driven Engineering …, 2022 | 10 | 2022 |
It's your loss: classifying information loss during variability model roundtrip transformations K Feichtinger, C Sundermann, T Thüm, R Rabiser Proceedings of the 26th ACM International Systems and Software Product Line …, 2022 | 9 | 2022 |
UVLParser: Extending UVL with Language Levels and Conversion Strategies C Sundermann, S Vill, T Thüm, K Feichtinger, P Agarwal, R Rabiser, ... Proceedings of the 27th ACM International Systems and Software Product Line …, 2023 | 8 | 2023 |
Incremental construction of modal implication graphs for evolving feature models S Krieter, R Arens, M Nieke, C Sundermann, T Heß, T Thüm, C Seidl Proceedings of the 25th ACM International Systems and Software Product Line …, 2021 | 7 | 2021 |
Exploiting d-DNNFs for Repetitive Counting Queries on Feature Models C Sundermann, H Raab, T Heß, T Thüm, I Schaefer arXiv preprint arXiv:2303.12383, 2023 | 6 | 2023 |
Tutorial on the Universal Variability Language C Sundermann, K Feichtinger, JA Galindo, D Benavides, R Rabiser, ... Proceedings of the 26th ACM International Systems and Software Product Line …, 2022 | 5 | 2022 |
ddueruem: a wrapper for feature-model analysis tools T Heß, T Müller, C Sundermann, T Thüm Proceedings of the 26th ACM International Systems and Software Product Line …, 2022 | 5 | 2022 |
Generic Solution-Space Sampling for Multi-domain Product Lines M Hentze, T Pett, C Sundermann, S Krieter, T Thüm, I Schaefer Proceedings of the 21st ACM SIGPLAN International Conference on Generative …, 2022 | 3 | 2022 |
Applications of #SAT Solvers for Product Lines C Sundermann Master’s thesis. TU Braunschweig, Germany. https://doi. org/10.24355/dbbs …, 2020 | 3 | 2020 |
Uvl: Feature Modelling with the Universal Variability Language D Benavides, C Sundermann, K Feichtinger, JA Galindo, R Rabiser, ... Available at SSRN 4764657, 2024 | 2 | 2024 |
UVLS: A Language Server Protocol For UVL J Loth, C Sundermann, T Schrull, T Brugger, F Rieg, T Thüm Proceedings of the 27th ACM International Systems and Software Product Line …, 2023 | 2 | 2023 |
Uvlhub: A Feature Model Data Repository Using Uvl and Open Science Principles D Romero-Organvídez, JA Galindo, C Sundermann, JM Horcas, ... Available at SSRN 4536607, 0 | 2 | |