| Picosecond electrical sampling using a scanning force microscope AS Hou, F Ho, DM Bloom Electronics Letters 28 (25), 2302-2303, 1992 | 153 | 1992 |
| High frequency attenuated total internal reflection light modulator O Solgaard, F Ho, JI Thackara, DM Bloom Applied physics letters 61 (21), 2500-2502, 1992 | 90 | 1992 |
| Electrical contact probe for sampling high frequency electrical signals F Ho, DM Bloom US Patent 5,847,569, 1998 | 79 | 1998 |
| Mechanical parametric amplification in piezoresistive gallium arsenide microcantilevers A Dana, F Ho, Y Yamamoto Applied Physics Letters 72 (10), 1152-1154, 1998 | 70 | 1998 |
| System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies DM Bloom, F Ho, AS Hou US Patent 5,381,101, 1995 | 53 | 1995 |
| Scanning probe microscopy for testing ultrafast electronic devices AS Hou, BA Nechay, F Ho, DM Bloom Optical and quantum electronics 28 (7), 819-841, 1996 | 52 | 1996 |
| Applications of an atomic force microscope voltage probe with ultrafast time resolution BA Nechay, F Ho, AS Hou, DM Bloom Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995 | 34 | 1995 |
| High-speed integrated circuit probing using a scanning force microscope sampler F Ho, AS Hou, DM Bloom Electronics Letters 30 (7), 560-562, 1994 | 24 | 1994 |
| System and method for high-speed potentiometry using scanning probe microscope DM Bloom, F Ho, AS Hou US Patent 5,488,305, 1996 | 18 | 1996 |
| High throughput flash memory system F Ho US Patent 8,316,175, 2012 | 13 | 2012 |
| Method of making released micromachined structures by directional etching F Ho, Y Yamamoto US Patent 6,086,774, 2000 | 9 | 2000 |
| Ultrafast voltage-contrast scanning probe microscopy F Ho, AS Hou, BA Nechay, DM Bloom Nanotechnology 7 (4), 385, 1996 | 7 | 1996 |
| Applications of scanning force microscopy for voltage measurements with high spatial and temporal resolutions F Ho, AS Hou, BA Nechay, DM Bloom Ultrafast Electronics and Optoelectronics, JWA1, 1995 | 4 | 1995 |
| High throughput flash memory system F Ho US Patent 9,053,009, 2015 | 3 | 2015 |
| Analysis and optimization of force sensitivity in atomic force microscopy using optical and electrical detection F Ho, Y Yamamoto Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 3 | 1998 |
| Brave New Nanoworld: Probing the Realm of Ultrafast, Ultrasmall Electronics DM Bloom, AS Hou, F Ho, BA Nechay SPRINGER SERIES IN CHEMICAL PHYSICS 60 (1), 17-17, 1994 | 3 | 1994 |
| Monolithically integrated optoelectronic thresholding devices for neural network applications S Lin, F Ho, J Kim, D Psaltis Conference on Lasers and Electro-Optics, CTuD1, 1991 | 3 | 1991 |
| Edward L. Ginzton Laboratory, Stanford University AS Hou, F Ho, DM Bloom Forces in Scanning Probe Methods 286, 63, 2012 | | 2012 |
| Photoconductive-sampling voltage measurement KR Wilsher, F Ho US Patent 6,737,853, 2004 | | 2004 |
| An Ultrafast Tunneling Sampler for Atomic-Resolution, High-Speed Electronic Measurements. BA Nechay, AS Hou, F Ho, DM Bloom STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS, 1996 | | 1996 |
