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ermakov a v
ermakov a v
在 chem.rutgers.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Electrostatic ion trap
AV Ermakov, BJ Hinch
US Patent 9,000,364, 2015
712015
Electrostatic ion trap
GA Brucker, KD Van Antwerp, GJ Rathbone, SC Heinbuch, MN Schott, ...
US Patent 8,586,918, 2013
592013
A novel afm/stm/sem system
AV Ermakov, EL Garfunkel
Review of scientific instruments 65 (9), 2853-2854, 1994
521994
Oxidation induced stress in SiO2/SiC structures
X Li, A Ermakov, V Amarasinghe, E Garfunkel, T Gustafsson, LC Feldman
Applied Physics Letters 110 (14), 2017
362017
An electrostatic autoresonant ion trap mass spectrometer
AV Ermakov, BJ Hinch
Review of Scientific instruments 81 (1), 2010
322010
Phosphine adsorption and the production of phosphide phases on Cu (0 0 1)
LV Goncharova, SK Clowes, RR Fogg, AV Ermakov, BJ Hinch
Surface Science 515 (2-3), 553-566, 2002
292002
Electron‐beam‐induced patterned deposition of allylcyclopentadienyl palladium using scanning tunneling microscopy
DS Saulys, A Ermakov, EL Garfunkel, PA Dowben
Journal of applied physics 76 (11), 7639-7641, 1994
291994
Cu (001) to HD energy transfer and translational to rotational energy conversion on surface scattering
LV Goncharova, J Braun, AV Ermakov, GG Bishop, DM Smilgies, ...
The Journal of Chemical Physics 115 (16), 7713-7724, 2001
272001
Three coil apparatus for inductive measurements of conductance
A Ermakov, BJ Hinch
US Patent 6,448,795, 2002
242002
Surface intercalation of graphite by lanthanum
GV Prudnikova, AG Vjatkin, AV Ermakov, AM Shikin, VK Adamchuk
Journal of electron spectroscopy and related phenomena 68, 427-430, 1994
201994
Application of a novel contactless conductivity sensor in chemical vapor deposition of aluminum films
AV Ermakov, BJ Hinch
Review of scientific instruments 68 (3), 1571-1574, 1997
181997
Effect of nitrogen passivation on interface composition and physical stress in SiO2/SiC (4H) structures
X Li, SS Lee, M Li, A Ermakov, J Medina-Ramos, TT Fister, ...
Applied Physics Letters 113 (13), 2018
162018
Adsorption of PF3 on Cu (001): Ordered overlayer structures and frustrated translational modes
J Braun, GG Bishop, AV Ermakov, LV Goncharova, BJ Hinch
The Journal of chemical physics 110 (11), 5337-5345, 1999
131999
Thermal Chemistry of CH3 on Si/Cu(100); the Role of Sn as a Promoter
XV Zhang, DR Strongin, LV Goncharova, AV Ermakov, BJ Hinch
The Journal of Physical Chemistry B 108 (41), 16213-16219, 2004
92004
Chlorosilane Production from Chlorine-Exposed Si (111) 7× 7 and Cu/Si (111) Surfaces
SE Sysoev, DV Potapenko, AV Ermakov, BJ Hinch, DR Strongin, ...
The Journal of Physical Chemistry B 106 (8), 2018-2025, 2002
72002
Chlorine-induced restructuring of the Cu/Si (111) surface
DV Potapenko, SE Sysoev, AV Ermakov, BJ Hinch, DR Strongin, ...
Physical Review B 68 (7), 075408, 2003
62003
Device for direct writing and reading-out of information based on the scanning tunneling microscope
VK Adamchuk, AV Ermakov
Ultramicroscopy 45 (1), 1-4, 1992
51992
Scanning tunneling microscope with large scan range
VK Adamchuk, AV Ermakov, SI Fedoseenko
Ultramicroscopy 42, 1602-1605, 1992
51992
Trajectory compensation in an autoresonant trap mass spectrometer
AV Ermakov, BJ Hinch
Journal of mass spectrometry 46 (7), 672-676, 2011
42011
A surface work function measurement technique utilizing constant deflected grazing electron trajectories: Oxygen uptake on Cu (001)
AV Ermakov, EZ Ciftlikli, SE Syssoev, IG Shuttleworth, BJ Hinch
Review of Scientific Instruments 81 (10), 2010
42010
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